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High-frequency loss and BH parameter analysis of soft magnetic materials and inductive devices

How to correctly evaluate the scenarios where magnetic cores of different materials meet high-frequency and high-current applications—the IWATSU B-H Analyzer System is the world's most authoritative and most widely applied high-frequency AC B-H characteristic tester for soft magnetic materials in this field.

WBG semiconductors - static parameter evaluation of silicon carbide power devices

Static and dynamic parameters of power devices are the most critical processes for evaluating device performance. Meeting device voltage and current test conditions is a basic requirement for instruments. High-power IGBT devices typically have turn-off voltages reaching several kV and conduction currents reaching several kA, and their switching times due to wide bandgap...

Power Semiconductor Datasheet Room-Temperature and High-Temperature Static Parameter Measurement Solution

Static parameter measurement of power devices can be achieved with the IWATSU CS-3000, IWATSU CS-5000 and IWATSU CS-8000 semiconductor curve characteristic analyzers. Supports measurement of device DC IV, Pul

IWATSU-CS3000/5000 Series Semiconductor Analyzer Gate Charge (Qg) Test Guide

Accurately measuring the gate charge (Qg) of power devices is crucial for optimizing switching power supply design and reliability evaluation. This article will systematically introduce how to complete this key test using the test solution of the CS semiconductor parameter analyzer.

SiC/GaN silicon carbide double-pulse dynamic parameter and dynamic on-resistance testing

Power Electronic Devices: Power semiconductor devices are high-power electronic devices mainly used for electrical energy conversion and control circuits in power equipment. The double pulse test is an important test for evaluating IGBTs that is widely adopted by engineers.

The Vamtek CX-600 series perfectly accommodates new low-Ls package SiC and GaN devices

Vamtek CX-600 Series full-Kelvin test sockets cover mainstream SiC and GaN new power packages such as TOLL, QDPAK, TO-247, TOLG, and HU3PAK; featuring industry-leading mechanical and electrical performance, paired with the PHS temperature control unit to enable high/low temperature testing from -55 to 200°C

KEYSIGHT B1505A/B1506A Test Box SiC Adapter TO or TOLL Test Socket Fixture

HSF-K13 & Cx series test socket solution compatible with Keysight B1505A, B1506A

UHV -- Optical Isolation Measurement of High-Voltage Grid Signals and UHV Signals

Product description: In response to the high-frequency, high-temperature, high-voltage and high-current characteristics exhibited by wide-bandgap semiconductors, as well as relatively harsh operating environments, we provide users with a variety of test front-end solutions

Electric vehicles—battery, electric drive, and motor performance and reliability measurement

The test system covers AC charging piles, DC charging piles (stations), on-board chargers (OBC), DC-DC, battery packs, HCU, MCU, electrical safety testing, and more, suitable for signal-level and power-level testing of electric vehicles

Piezo piezoelectric ultrasonic materials—devices—motor research

Piezo piezoelectric, ultrasonic

High-energy laser equipment manufacturing and research

High energy lasers

Wafer-level microelectronic chip - wafer on-wafer parameter testing

Product description: Mainly applied in scientific research fields such as semiconductor microelectronics, electronics, electromechanics, physics, chemistry, materials, optoelectronics, nanotechnology, MEMs, biochips, aerospace, as well as IC

High-voltage inverters—signal (conversion or inversion) measurement of complex high-voltage equipment

When multiple IGBTs are used in series or parallel, precisely controlling the dead time of each IGBT is very important.

Frontier research—precise measurement of extremely weak signals

Weak signals mainly refer to acoustic, optical, or electrical signals with low intensity—both small and weak—that are difficult to receive, perceive, or be picked up by equipment. Weak signals are extremely faint signals buried deep in background noise.