IWATSU SY-8260 Series SY-8264 Model 30MHz B-H Analyzer High-Frequency Magnetic Loss System

IWATSU's latest B-H analyzer will be officially launched in the Chinese market in the first half of 2026.

Multiple frequency bandwidth options: 10 Hz–1 MHz, 10 Hz–10 MHz, and 10 Hz–30 MHz.

Fully compatible with the SY-8219 and SY-8218 B-H analyzers, as well as existing systems including the SY-320A, SY-321A, and SY-330A automated high/low-temperature scanning systems, the SY-960, SY-961, and SY-962 DC bias loss evaluation systems, and the SY-5001 power amplifier.

The SY-8264 series is designed for R&D on high-frequency soft magnetic materials, high-frequency loss testing, B-H parameter measurement, and B-H curve analysis. It is particularly well suited to amorphous and nanocrystalline alloys, Fe-Si, Fe-Si-Al, Fe-Ni, MnZn ferrite, and NiZn ferrite—the new-generation high-frequency inductors and planar transformers used for current filtering in SiC and GaN devices.

The SY-8264 series is used for R&D of high-frequency soft magnetic materials, high-frequency loss testing, B-H parameters, and B-H curve analysis. It is particularly suitable for scenarios such as amorphous nanocrystalline, iron-silicon, iron-silicon-aluminum, iron-nickel, manganese-zinc ferrite, nickel-zinc ferrite, and other new-generation high-frequency inductors and planar transformer device applications for current filtering in SiC and GaN devices.