Measurement methods for current collapse effects in gallium nitride (GaN) devices (AlGaN/GaN HEMTs)

2026-01-14 263

Current collapse is a degradation phenomenon unique to gallium nitride (GaN) devices—particularly AlGaN/GaN HEMTs—under high-voltage stress. It manifests as a drop in output current and an increase in on-resistance, severely compromising power output and reliability.

Current Status and Prospects of Soft Magnetic Metal Powder Core Materials

2023-06-06 793

Current status and prospects of soft magnetic metal powder core materials. By chemical composition, soft magnetic materials are divided into metal soft magnetic materials and ferrite soft magnetic materials. Before the advent of ferrite soft magnetic materials, metal soft magnetic materials such as pure iron, permalloy, iron-silicon alloy, and iron-silicon-aluminum alloy were used; they feature high μ and high Bs but low resistivity (about...

Research Progress on High-Frequency Soft Magnetic Materials for SiC and GaN Power Electronic Devices

2026-01-24 168

; Ferrites are mainly used in inductors, filters, and other components in switching power supplies and power adapters; although amorphous nanocrystalline and soft magnetic composite materials developed later, they are expected to replace, and have already partially replaced, traditional soft magnetic materials. However, as a soft magnetic material system, they all develop toward high frequency, low loss, high permeability, and high energy flux density [9, 10], therefore...

Application differences of the Kelvin four-wire method, four-probe method, van der Pauw method, and Chen Cunli method in measuring resistance-related parameters

2024-11-28 3325

When measuring resistance-related parameters, engineers may have heard of the Kelvin 4-wire method for resistance measurement, the 4-probe method for resistivity measurement, the van der Pauw method, the Chen Cunli method, and many others. With so many methods to choose from, engineers often find it difficult to quickly select the right test method.

How to use Lissajous figures in AC mode on the IWATSU CS-3300 curve tracer for failure analysis

2025-09-28 202

Iwatsu's CS-3300 Curve Tracer is a comprehensive instrument commonly used by semiconductor engineers for failure analysis and characteristic curve analysis of discrete semiconductor devices. Today, let's discuss a method for semiconductor failure analysis or for quickly determining whether a discrete device has failed and rapidly outlining its electrical performance.

Types of electron irradiation accelerators and typical applications (changes in electrical characteristics of semiconductor materials and devices under irradiation conditions)

2024-06-13 435

Electron irradiation accelerators are numerous in type and vary in performance and application. By energy range and main application, they can be divided into 3 categories: (1) Low-energy (0.1 MeV - 0.3 MeV) accelerators: the representative type is the electron curtain accelerator, a high-voltage accelerator without an accelerating tube or scanning device, featuring small size, regular shape, self-shielding function, and structure...