IWATSU CS-605/603A Silicon Carbide Device C-V High-Voltage 5KV Tester Iwatsu Japan

Model：CS-605/603      Country of Origin：Japan      Category：CV Parameter Tester

Overview：Automated capacitance measurement up to 5kV (CS-605) or 3kV (CS-603) (with sweep function), capable of measuring Cies, Ciss (input capacitance), Coes, Coss (output capacitance), Cres, Crss (reverse transfer capacitance), CT (terminal-to-terminal capacitance), Cgs, Cge/Cgd, Ccg/Cds, Cce (calculated values), Rg (gate resistance)

Tonghui Electronics TH510 Series TH511, TH512, TH513 Semiconductor C-V Characteristic Analyzer

Model：TH510SeriesTH511、TH512、TH513      Country of Origin：China      Category：CV Parameter Tester

Overview：The TH510 series semiconductor C-V characteristic analyzer is an analytical instrument from Tonghui Electronics for the production and R&D of semiconductor materials and devices. The TH510 series innovatively adopts a dual-CPU architecture, Linux underlying system, 10.1-inch capacitive touchscreen, Chinese/English operation interface, and built-in instructions and help, suitable for rapid sorting on production lines, automated integrated testing, and laboratory R&D and analysis.

TEKTRONIX KEITHLEY 590 C-V Analyzer/Quasi-Static CV

Model：590      Country of Origin：USA      Category：CV Parameter Tester

Overview：he Keithley Model 590 CV Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the Model 590 has been tailored to the requirements of semiconductor device testing.