Apollowave a-300CS Apollo -60/350 Degree High-Low Temperature RF Manual Probe Station System

Model：a-300CS      Country of Origin：Japan      Category：RF/Microwave Probe Station

Overview：Supports wafers up to 12 inches, high-frequency low-leakage testing at temperatures from -60 to +350°C, and also supports custom RF probe cards.

CASCADE-IWATSU Tesla series 8-inch high-voltage SiC probe station system

Model：Tesla       Country of Origin：USA-Japan      Category：RF/Microwave Probe Station

Overview：CASCADE-IWATSU Tesla is the industry's first power device measurement system, providing a complete on-wafer solution for over-temperature, low-contact-resistance measurement of power semiconductors at currents up to 400A and voltages up to 3000V. The new system employs two new wafer probes and an entirely new wafer chuck technology.

Cascade Summit200 FormFactor Fully/Semi-Automatic Probe Station

Model：Summit200      Country of Origin：USA      Category：RF/Microwave Probe Station

Overview：Summit200 is designed for R&D, device characterization, modeling, or small-volume production, ensuring low-noise, DC, RF, mmW, and THz accurate measurements with the fastest possible data acquisition. Available in semi-automatic or fully automatic configurations.

Cascade EPS200RF RF Probe Station

Model：EPS200RF      Country of Origin：USA      Category：RF/Microwave Probe Station

Overview：The EPS200RF is an 8-inch manual probe station designed specifically for RF and microwave measurement characterization. By configuring ACP, Infinity, Z-series probes, signal integrity probes, RF probe holders, RF cables, calibration substrates, contact substrates, and RF software, it enables RF measurement characterization of wafers, fragments, and single dies across the DC-67GHz range.