Technical Support
Feedback
High-Temperature Chip Acceptability Test System WAT-200KA
Model：WAT-200KA Country of Origin：Japan Category：WAT Wafer Acceptance Test System
Overview：This system is specially developed for on-wafer wafer-level IV/CV electrical performance testing/inspection and reliability electrical testing of wafers for two-terminal and three-terminal power devices such as diodes, transistors, MOSFETs, IGBTs, and wide-bandgap power devices. It supports TAIKO-spec wafers and is backward compatible with conventional wafer and chip testing. The system can perform I-V/C-V characteristic inspection testing in the MOSFET, IGBT, and other power device chip manufacturing process, and on-wafer static characteristic testing of IGBT/FRD chips.
