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Power Transistor Curve Tracer Semiconductor Parameter Analyzer SMU Source Measure Unit Dynamic Parameter Test System CV Parameter Tester Gate Charge (Qg) Tester WAT Wafer Acceptance Test System TLP Transmission Line Pulse EMMI Low-Light Infrared Fault Localization HCI/BTI/TDDB/EM effects Femtoammeter/Electrometer/High Resistance Meter High and low temperature electrical performance simulation H3TRx Customizable System Integration Software

Standard Manual Probe Station Portable Desktop Probe Station Semi-automatic probe station RF/Microwave Probe Station High/Low Temperature Probe Station Vacuum cryogenic probe station system Wafer electrical parameter test system Strong Magnetic - Hall Probe Station Custom Precision Probe Card High/Low Temperature Chuck System (Taiko) Magnetic Probe Holder CCD Microscope Test cables and adapter fixtures Shielded Box and Vibration Isolation Table Probes and other accessories

B-H Analyzer Magnetic Loss Power Tester Impedance Analyzer DC Bias High-Frequency LCR Meter Vector Network Analyzer VNA Frequency Response Analyzer Milliohm Meter / Battery Internal Resistance Tester

Rapid Temperature Change Thermal Flow Meter Device High/Low Temperature Platform Thermalplate Device junction temperature simulator Tj

12-bit high-definition digital oscilloscope Optically Isolated Oscilloscope System Basic Digital Oscilloscope Signal generator Digital Multimeter DMM Spectrum Analyzer Frequency counter Infrared thermal imager

Optically isolated voltage probe Optically Isolated Current Probe Dynamic On-Resistance Rds(on)dynamic Oscilloscope voltage probe High-voltage differential probe Fluxgate current transformer AC/DC Current Probe Non-inductive coaxial shunt Communication Interfaces and Cables Dedicated fixture Software

Multi-channel data acquisition instrument Data Acquisition and Playback Power Analyzer

Digital Phase-Locked Loop Amplifier Ultra-Low Noise Preamplifier Precision Current Amplifier Precision Differential Amplifier Precision Filter Light chopper Precision Low-Noise DC Power Supply

Programmable DC Power Supply DC Electronic Load Precision Bipolar Power Amplifier Bipolar simulation power supply

Safety Tester (ACI/DCI/IR/GB) High-voltage meter HV meter

Standard or calibration source meter Standard current and voltage meters

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Bandwidth： All DC <100Mhz >1GHZ

Channel： All Single Channel Dual Channel Multi-channel

Accuracy: All ppm-level Class 0.1 Class 0.2 Class 0.5

Attribute: All Current Voltage Spectrum Phase Impedance Temperature Magnetism Acoustics Optics

Easycon 200X semiconductor parameter analysis software system

Model：Easycon 200X Country of Origin：China Category：Customizable System Integration Software

Overview：Independently developed by JECTRONIC, this is a highly integrated platform software for comprehensive semiconductor parameter applications such as IWATSU semiconductor parameter analyzers, KEITHLEY source measure units, and Lianxun source measure units, and can be extended with high/low temperature control, temperature control, optical, and other peripherals.

IWATSU (Japan) - PMK, Germany - N4LN4L- USA T&M - Japan APOLLOWAVE - Germany DR HUBERT China General Agent

B-H Analyzer|Semiconductor Curve Tracer|Probe Station-Probe Card|Silicon Carbide Double Pulse|Optically Isolated Probe|UHV Floating|PSM3750 Frequency Response|Rogowski Current Coil|PMK High-Voltage Differential Probe|Piezoelectric Ultrasonic High-Frequency Power Amplifier