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More Products>- Semiconductor Material and Device Parameter Analysis
- Chip Probe Station System
- Magnetic Materials and Device Analysis
- ThemaStream Heat Flow Simulator
- General-Purpose Electronic Instruments
- Sensor probes and software
- Data Acquisition and Power Parameter Analysis
- Weak signal measurement instruments
- Power and Load System
- Withstand Voltage and Leakage Safety Compliance Measurement
- Standard source or calibration instrument
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IWATSU SY-8260 Series SY-8264 Model 30MHz B-H Analyzer High-Frequency Magnetic Loss System
IWATSU CS-3300 Power Semiconductor Parameter Analysis 3000V@1000A JEDEC Curve Tracer Iwatsu Japan
IWATSU CS-8000 Semiconductor Parameter Analyzer CS-8500 Curve Tracer Iwatsu Japan
KEYSIGHT B1505A 10KV-1500A Keysight Power Semiconductor Parameter Analyzer Qg
IWATSU SY-8218\SY-8219 IWATSU Soft Magnetic AC B-H Core Loss POWER LOSS Analyzer
IWATSU CS-5100, CS5200, CS5300, CS5400 Power Semiconductor I-V Static Parameter Curve Tracer Iwatsu Japan
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Iwatsu Electric Co ,Ltd (Head Office)International Sales Dept , Test Instruments Group 7-41, Kugayama 1-Chome, Suginami-ku, Tokyo, 168-8501 JapanTEL : +81-3-5370-5483FAX : +81-3-5370-5230E-mail:info-tme@iwatsu co jpHong Kong and China :MI
- GRAPHTEC-IWATSU Exhibits at PCIM Asia Shenzhen 2026 and Simultaneously Launches Multiple New Products! 2026-09-01
- IWATSU and Graphtec merge; new company GRAPHTEC IWATSU Test Instruments Co., Ltd. officially established on July 1. 2026-07-10
- Ligao Jiechuang has been successfully selected as a 2025 National High-Tech Enterprise and has also received provincial special funds for science and technology and foreign trade. 2025-12-19
- Opsens Solutions Fiber Optic Sensors for Various Power Electronics Applications – with Paper List 2025-10-22
- Jiechuang Instruments joins hands with IWATSU to continue participating in PCIM Asia 2025 at the Shanghai International Exhibition Center 2025-09-29
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Current collapse is a degradation phenomenon unique to gallium nitride (GaN) devices—particularly AlGaN/GaN HEMTs—under high-voltage stress. It manifests as a drop in output current and an increase in on-resistance, severely compromising power output and reliability.
- Current Status and Prospects of Soft Magnetic Metal Powder Core Materials 2023-06-06
- Research Progress on High-Frequency Soft Magnetic Materials for SiC and GaN Power Electronic Devices 2026-01-24
- Application differences of the Kelvin four-wire method, four-probe method, van der Pauw method, and Chen Cunli method in measuring resistance-related parameters 2024-11-28
- How to use Lissajous figures in AC mode on the IWATSU CS-3300 curve tracer for failure analysis 2025-09-28
- Types of electron irradiation accelerators and typical applications (changes in electrical characteristics of semiconductor materials and devices under irradiation conditions) 2024-06-13
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