Quick Contact>

Hotline

0731-85260926 18665876229

中文
Power Transistor Curve Tracer Semiconductor Parameter Analyzer SMU Source Measure Unit Dynamic Parameter Test System CV Parameter Tester Gate Charge (Qg) Tester WAT Wafer Acceptance Test System TLP Transmission Line Pulse EMMI Low-Light Infrared Fault Localization HCI/BTI/TDDB/EM effects Femtoammeter/Electrometer/High Resistance Meter High and low temperature electrical performance simulation H3TRx Customizable System Integration Software
Standard Manual Probe Station Portable Desktop Probe Station Semi-automatic probe station RF/Microwave Probe Station High/Low Temperature Probe Station Vacuum cryogenic probe station system Wafer electrical parameter test system Strong Magnetic - Hall Probe Station Custom Precision Probe Card High/Low Temperature Chuck System (Taiko) Magnetic Probe Holder CCD Microscope Test cables and adapter fixtures Shielded Box and Vibration Isolation Table Probes and other accessories
B-H Analyzer Magnetic Loss Power Tester Impedance Analyzer DC Bias High-Frequency LCR Meter Vector Network Analyzer VNA Frequency Response Analyzer Milliohm Meter / Battery Internal Resistance Tester
Rapid Temperature Change Thermal Flow Meter Device High/Low Temperature Platform Thermalplate Device junction temperature simulator Tj
12-bit high-definition digital oscilloscope Optically Isolated Oscilloscope System Basic Digital Oscilloscope Signal generator Digital Multimeter DMM Spectrum Analyzer Frequency counter Infrared thermal imager
Optically isolated voltage probe Optically Isolated Current Probe Dynamic On-Resistance Rds(on)dynamic Oscilloscope voltage probe High-voltage differential probe Fluxgate current transformer AC/DC Current Probe Non-inductive coaxial shunt Communication Interfaces and Cables Dedicated fixture Software
Multi-channel data acquisition instrument Data Acquisition and Playback Power Analyzer
Digital Phase-Locked Loop Amplifier Ultra-Low Noise Preamplifier Precision Current Amplifier Precision Differential Amplifier Precision Filter Light chopper Precision Low-Noise DC Power Supply
Programmable DC Power Supply DC Electronic Load Precision Bipolar Power Amplifier Bipolar simulation power supply
Safety Tester (ACI/DCI/IR/GB) High-voltage meter HV meter
Standard or calibration source meter Standard current and voltage meters
Products
Jiechuang self-developed PD-200X multi-purpose double-pulse (DPT) device dynamic parameter analysis system

Jiechuang self-developed PD-200X multi-purpose double-pulse (DPT) device dynamic parameter analysis system

Model:PD-200X      Country of Origin:China

Category:Dynamic Parameter Test System

Overview:

The PD-200X is a versatile dynamic parameter test and analysis system for power devices, extensively developed by Jiechuang Instruments. Its minimal-loop architecture keeps system inductance Ls < 20 nH. The modular design offers excellent instrument and probe compatibility, while high-redundancy safety features protect both devices and personnel during high-voltage, high-current testing.

It is currently the most cost-effective double-pulse test system available, making it particularly well suited to universities, research groups, and startup semiconductor companies.

Features
Specifications
Application Notes
Functions & Configuration

PD-200X Double-Pulse Test Platform: Unmatched Cost-Performance and Versatility

--- Built on a high-performance, multifunctional, flexible adapter fixture, it delivers outstanding cost-performance and versatility, ideal for university labs and startup teams.

1718357903667.png

  • Supports both TO-247-3 and TO-247-4 packages;

  • Explosion-proof, high-temperature-resistant, shock-proof, high-visibility design;

  • Independent programmable Rg on/Rg off settings;

  • Gate voltage adjustable across 16 modes (-5V to 18V);

  • Optional multi-temperature environments including 125°C, 150°C, and 175°C;

  • Maximum operating voltage >1200V, expandable to 1700V

  • Maximum operating current >1000A/100us

  • Adjustable single-pulse, double-pulse, and long-pulse modes, with optical fiber and BNC output options

  • Standard 6-step load inductance, independently adjustable

  • Standard optically isolated probe measurement ports compatible with Tektronix, PMK, and Micsig

  • Supports differential probes from all brands (standard interface)

  • Standard custom low-Ls shunt fixture, supports Ids testing with 2GHz coaxial shunt

  • Standard 150°C-rated Rogowski coil for non-invasive Ids testing

  • Compatible with oscilloscopes from all brands (DS-8054-SWA recommended)

1718358184262.jpg

Looking for more sales, technical and solutions information?

Contact Us >

Leave a Message

Hotline

0731-8526092618665876229

We will get back to you as soon as possible. Thank you!
(Jectronic handles your information with care. By submitting, you confirm that you have read and agree to the personal information transfer statement of this website.)

Inquiry Type: Message