5kV-class Semiconductor Curve Tracer / IGBT Semiconductor Parameter Tester
CS-5000 Series
Ideal for breakdown measurement of power devices with 5,000V withstand voltage
CS-5400 CS-5300 CS-5200 CS-5100
Maximum peak voltage 5,000V (high-voltage mode)
Maximum peak current 1,500A (CS-5400 high-current mode)
Same dimensions as the CS-3000 Series while achieving 5,000V
CS-5400/CS-5300/CS-5200 have the same dimensions as the CS-3300/CS-3200
CS-5100 has the same dimensions as the CS-3100
3kV-class Semiconductor Curve Tracer / IGBT Semiconductor Parameter Tester
CS-3000 Series
Suitable for characteristic measurement of various semiconductors (such as IGBTs, MOSFETs, transistors, and diodes)
CS-3300 CS-3200 CS-3100
Maximum peak voltage 3,000V (high-voltage mode)
Maximum peak current 1,000A (CS-3300 high-current mode)
LEAKAGE mode equipped on all models (cursor resolution 1pA)
USB port for screen capture and saving settings
LAN interface for remote control
Semiconductor Curve Tracer - Basic Model CS-3100-300V
The functions of the CS-3000 Series are ideal for measuring the characteristics of various semiconductors (such as SiC IGBTs, MOSFETs, transistors, and diodes).
• Maximum peak voltage 300V
• Maximum peak current 7.5A
• LEAKAGE mode equipped on all models (cursor resolution 1pA)
• USB port for screen capture and saving settings
• LAN interface for remote control or adjustment
HV mode maximum peak voltage / maximum peak current (pulse current)
| Mode | CS-3000 Series | CS-5000 Series |
Leakage/DC Full-wave rectification/AC | 3kV/75m (A 150mA) | 5kV/25m (A 25mA) |
| 300V/750m (A 1.5A) |
| 30V/7.5 (A 15A) |
HC mode maximum peak current / maximum peak power / maximum peak voltage
| Mode | CS-3100-300V CS-3100 CS-5100 | CS-3200 CS-5200 | CS-3300 CS-5300 | CS-5400 |
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| ±Pulse | (Not equipped with HC mode) | 400A/4kW/40V | 1,000A/10kW/40V | 1,500A/12kW/30V |
| 40A/400W/40V | 400A/4kW/40V | 600A/4.5kW/30V |
| 40A/400W/40V | 60A/450W/30V |
CS-810
Fully automatic measurement
■ Fully automatic control of the main unit, scanner (CS-700 series), hot plate, etc.
■ "Transfer measurement" not achievable with the standard functions of the main unit
■ Waveform comparison function for up to 10 waveforms
It is possible to compare many waveforms retained after measurement during development, such as for variation and defect analysis, and it features a pass/fail judgment function.
1) Waveform display
Previously acquired CSV files, recalled curve tracer waveforms, and currently acquired waveforms can be displayed simultaneously on the same graph, up to 10 waveforms.
2) Waveform comparison and judgment
Pass/fail can be judged by comparing with reference data.
3) Rescaling function
The voltage axis of the displayed waveform is saved to a CSV file at arbitrary intervals. When placing measurement results in a table, the voltage axes can be aligned.
4) Graph image saving
Graphs, file lists, and cursor values can be combined in any arrangement and saved to an image file.
(Image formats: PNG/BMP/JPG/TIFF)
