Quick Contact>

Hotline

0731-85260926 18665876229

中文
Power Transistor Curve Tracer Semiconductor Parameter Analyzer SMU Source Measure Unit Dynamic Parameter Test System CV Parameter Tester Gate Charge (Qg) Tester WAT Wafer Acceptance Test System TLP Transmission Line Pulse EMMI Low-Light Infrared Fault Localization HCI/BTI/TDDB/EM effects Femtoammeter/Electrometer/High Resistance Meter High and low temperature electrical performance simulation H3TRx Customizable System Integration Software
Standard Manual Probe Station Portable Desktop Probe Station Semi-automatic probe station RF/Microwave Probe Station High/Low Temperature Probe Station Vacuum cryogenic probe station system Wafer electrical parameter test system Strong Magnetic - Hall Probe Station Custom Precision Probe Card High/Low Temperature Chuck System (Taiko) Magnetic Probe Holder CCD Microscope Test cables and adapter fixtures Shielded Box and Vibration Isolation Table Probes and other accessories
B-H Analyzer Magnetic Loss Power Tester Impedance Analyzer DC Bias High-Frequency LCR Meter Vector Network Analyzer VNA Frequency Response Analyzer Milliohm Meter / Battery Internal Resistance Tester
Rapid Temperature Change Thermal Flow Meter Device High/Low Temperature Platform Thermalplate Device junction temperature simulator Tj
12-bit high-definition digital oscilloscope Optically Isolated Oscilloscope System Basic Digital Oscilloscope Signal generator Digital Multimeter DMM Spectrum Analyzer Frequency counter Infrared thermal imager
Optically isolated voltage probe Optically Isolated Current Probe Dynamic On-Resistance Rds(on)dynamic Oscilloscope voltage probe High-voltage differential probe Fluxgate current transformer AC/DC Current Probe Non-inductive coaxial shunt Communication Interfaces and Cables Dedicated fixture Software
Multi-channel data acquisition instrument Data Acquisition and Playback Power Analyzer
Digital Phase-Locked Loop Amplifier Ultra-Low Noise Preamplifier Precision Current Amplifier Precision Differential Amplifier Precision Filter Light chopper Precision Low-Noise DC Power Supply
Programmable DC Power Supply DC Electronic Load Precision Bipolar Power Amplifier Bipolar simulation power supply
Safety Tester (ACI/DCI/IR/GB) High-voltage meter HV meter
Standard or calibration source meter Standard current and voltage meters

About Us

About Us

You are here: Home > About Us > Company News

About Us

Changsha Ligao Instrument becomes the general agent of WAYNE KERR in Central China

Published: 2021-05-29 Views: 次

Founded in 1946, Wayne Kerr has been a leading manufacturer of electronic measurement instruments for over 60 years. Its component testing solutions—including LCR meters, impedance analyzers, and high-frequency measurement instruments—are favored by customers worldwide for their precision, functionality, and reliable quality. Wayne Kerr continually listens to customer needs and delivers improved product quality and after-sales service.

   To strengthen customer service, technical support, and product repair capabilities, Wayne Kerr has established offices in the United States, the United Kingdom, Germany, Singapore, India, Japan, and Shenzhen and Suzhou in mainland China. Beyond providing superior measurement instrument technology, these offices enable face-to-face communication with customers to understand their latest test requirements and deliver better test solutions—helping customers accelerate time to market and capture new business opportunities.

    On May 16, Ligao Jiechuang Instrument Co., Ltd. signed an agreement in Shenzhen with Wayne Kerr's China representative office to become its core distributor in South China. This partnership recognizes Ligao Jiechuang's long-standing market share in the magnetic components field and its highly capable technical team in magnetic component test and measurement. The collaboration is certain to be a win-win for both parties.

blob.png