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Founded in Tokyo, Japan in 1938, Iwatsu Test Instruments Corporation is one of the most renowned and premier manufacturers in the global electronic test and measurement industry. Its high-performance oscilloscopes are used worldwide. In 2008, the company launched Japan's first power semiconductor curve tracer capable of testing up to 3000 V and 1000 A, and it has since been widely adopted by Japanese semiconductor manufacturers and in the railway and industrial control sectors. It fully replaces the TEKTRONIX 370B/371 Curve Tracer semiconductor curve tracer.
Features of the CS-3000
1. Maximum peak test voltage: 3000 V (the original Tektronix product maxed out at 2000 V)
2. Maximum peak test current: 1000 A (the original Tektronix product maxed out at 400 A)
3. Leakage current test mode with 1 pA resolution (on the original TEK product, this function required an additional TEK 371A)
4. USB and LAN interfaces for convenient data storage and recall (image and Excel files). (TEK products use floppy disks, which is highly inconvenient.)
5. LAN interface supports remote device control
6. Dual WAVE (oscilloscope) and TRACE (curve tracer) modes let you select test points manually, avoiding measurement in device oscillation regions and ensuring maximum data reliability.
The Iwatsu CS3000 series semiconductor curve tracer is a world-class power semiconductor test instrument. It supports power semiconductor testing at peak voltages up to 3000 V and peak currents up to 1000 A, although high-current and high-voltage modes cannot be tested simultaneously. The CS3000 series can measure power semiconductors such as IGBT power devices, as well as MOSFET power devices and simpler devices such as transistors, diodes, and LEDs.
The CS-3300's unique WAVEFORM mode makes test condition setup easier and more effective. Operators can observe the voltage and current waveforms between the terminals of the IGBT under test in real time and adjust the relevant parameters (such as test duration, voltage, current, and measurement points) based on the results, ensuring accurate and stable measurements.
The CS-3300 series main unit comes standard with USB and LAN interfaces, making it easy for customers to quickly and accurately save test data, archive records, and generate reports—tasks that were previously quite cumbersome.
The CS-3000's test modes and parameters fully match the performance of the TEK 370/A/B, 371/A/B and their accessories, with peak voltages up to 3000 V and peak currents up to 1000 A.
Below are sample test screenshots from the CS-3300:
Device simulation
DC mode test
Output curves
AC mode
LEAKAGE test
Connection mode block diagram
CS-3300 standard configuration specifications
Test system components:
1. CS-3300 main unit
2. CS-302M test fixture
3. CS-500 test adapter
4. Standard test cables
5. AUX DC POWER ±40 V, ±100 mA (included in the main unit)
CS-3300 technical specifications:
(1) High-voltage mode: 3000 V standard (2500 V at AC) / 3300 V maximum (5000 V and 10000 V test instruments available on request)
(2) High-current mode: 1000 A (pulsed) (4000 A test instruments available on request)
(3) VG gate voltage: ±40 V
(4) Overall basic accuracy: 2% of reading + 0.05% × DIV adjustment accuracy (factory-new units are guaranteed to meet or exceed this accuracy)
(5) Leakage current test mode with 1 pA current cursor resolution
(6) DC mode supported. When measuring leakage current, the CS-3300's unique DC (direct current) mode greatly reduces measurement error.
(7) Measurable IGBT parameters include DC parameters such as ICES, BVCES, IGESF, IGESR, VGETH, VGEON, VCESAT, ICON, and VF.
(8) Pulse width of 50–400 µs with 10 µs adjustment resolution.
(9) Selectable curve sweep points from 20 to 1000; the simplified mode shortens single-test time and greatly improves test efficiency.
(10) WAVEFORM mode supports simulation testing of the IGBT's actual operating conditions. (See the second paragraph of P4 in this manual.)
(11) The test enclosure features a software and hardware interlock design to protect operators during high-voltage, high-current testing.
(12) USB interface supports hard copy of screen information; data is saved in CSV format and can be edited in Excel.
(13) LAN interface supports remote device control.
Device types and parameters testable with the CS-3300:
Iwatsu Test Instruments can test the static I-V characteristics of most semiconductors, including IGBTs, MOSFETs, transistors, and diodes, giving users flexibility in testing a wide variety of components. However, due to their specific electrical characteristics, the CS-3300 cannot test the V-I characteristics of IGCTs and GTOs.
Measurable IGBT parameters include DC parameters such as ICES, BVCES, IGESF, IGESR, VGETH, VGEON, VCESAT, ICON, and VF.
For more detailed data, please contact the Jiechuang Ligao Technical Support Center directly: 0731-85260926
