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Changsha Ligao Jiechuang Instruments unveiled a new power semiconductor dynamic testing solution at the 7th International Academic Forum of the China Power Semiconductor Industry Alliance.

Published: 2021-10-19 Views: 次

On October 15, the Hunan Province Power Semiconductor Industry Matchmaking Conference and the 7th International Academic Forum of the Power Semiconductor Industry Alliance, jointly hosted by the Hunan Provincial Department of Industry and Information Technology, the Zhuzhou Municipal People's Government, and the Power Semiconductor Industry Alliance, were held in Zhuzhou.WeChat Image_20211019092258.jpg

At the academic forum, industry experts from home and abroad delivered thematic reports on power semiconductor materials, devices, packaging, applications, and other aspects. The speakers included Feng Zhihong, Chief Scientist of China Electronics Technology Group Corporation and Doctoral Supervisor at the Chinese Academy of Electronics and Information Technology; Sheng Kuang, Qiushi Distinguished Professor and Doctoral Supervisor at Zhejiang University and Dean of the College of Electrical Engineering; Luo Haihui, Chief Technical Expert of CRRC and Executive Deputy General Manager and Director of the R&D Center of Zhuzhou CRRC Times Semiconductor Co., Ltd.; Wen Xuhui, Researcher and Doctoral Supervisor at the Institute of Electrical Engineering, Chinese Academy of Sciences; Mei Yunhui, Professor and Doctoral Supervisor at the School of Electrical and Electronic Engineering, Tiangong University and Vice President of the Institute of Science and Technology; Sun Chenguang, Deputy General Manager of Zhonghuan Leading Semiconductor Materials Co., Ltd.; Dr. Martin Kuball of the University of Bristol, UK; Munaf Rahimo, General Manager of MTAL Ltd., Switzerland; Liu Xuanjie, Executive Vice President of Technology R&D and Marketing Sales at SMIC Integrated Circuit Manufacturing (Shaoxing) Co., Ltd.; and Jiang Li, Associate Researcher at the Institute of Plasma Physics, Hefei Institutes of Physical Science, Chinese Academy of Sciences.

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Changsha Ligao Jiechuang Instrument Co., Ltd. presented its latest dynamic and static parameter test solutions for wide-bandgap devices at the exhibition. The company held multiple in-depth exchanges and product demonstrations with industry experts and R&D test engineers. Live testing further strengthened users' recognition of the company's solutions, and the conference and exhibition achieved excellent results.