Changsha Ligao Jiechuang Instruments & IWATSU Japan Iwatsu Measurement jointly participated in the 24th China Power Supply Society Academic Annual Conference (CPSSC)

Published: 2021-11-19 Views: 次

The China Power Supply Society Conference (CPSSC), held biennially, was founded in 1978 and has been successfully held 23 times. The event features a rich format including academic and technical exchanges, industry exhibitions, and special activities. Concurrently, important events such as the China Power Supply Society Science and Technology Award ceremony and the University Power Electronics Application Design Competition finals are held, forming an integrated four-in-one platform of conference, exhibition, competition, and awards—the largest and highest-level comprehensive industry exchange event in China's power supply field.

The event brings together renowned experts and scholars, senior corporate executives, R&D engineers, frontline engineers, and graduate students from the power supply field both domestically and internationally. Participants summarize and exchange new technologies, new achievements, new products, and new solutions across various power supply domains, comprehensively showcase the development level of power supply technology and industry, discuss future development directions, and promote technological innovation and progress in China's power supply industry.

Changsha Ligao Jiechuang Instrument Co., Ltd. presented IWATSU's full line of electronic instrument products—including the high-precision digital oscilloscope DS-8000, optically isolated test systems DM-8000H and SE-6000, high-voltage differential measurement system BumbleBEE, high-speed pulse signal generator DG-8000, high-frequency Rogowski current probes SS-280A, SS-620, SS-290, SS-680, AC/DC Hall probes SS-570 and SS-560, power semiconductor curve tracers CS-3000, CS-5000, CS-8000, B-H analyzer systems SY-8218 and SY-8219, power inductor DC bias measurement system SY-960, and high-frequency C-V tester CS-603A—at this industry exchange event. The company engaged in multi-dimensional exchanges with frontline engineers and professors from universities, research institutes, and corporate R&D centers, discussing solutions for high-precision power signal/current/voltage/loss evaluation under wide-bandgap device application conditions.

Conference Chairman: Professor Xu Dehong of Zhejiang University delivered the opening ceremony address.

Evaluation of dynamic performance such as switching parameters of wide-bandgap devices:

       Static and dynamic performance characterization of high-frequency, high-power SiC and GaN power electronic devices.