PHS-100S Single-Channel SiC/GaN Device Tj Simulation and High-Temperature Short-Circuit Failure Analysis System

Model：PHS-100S      Country of Origin：China      Category：Device junction temperature simulator Tj

Overview：The PHS-100S compact power semiconductor temperature control test system is a miniaturized, high-precision, fanless temperature control system, optimized for static parameter, dynamic characteristic, and reliability testing of power semiconductors (IGBT, SiC, GaN). It uses low-voltage power supply and a patented structure, along with effective high-temperature protection, to ensure the safety of devices and personnel.

PHS-100D Dual-Channel SiC/GaN Device Tj Simulation and High-Temperature Short-Circuit Failure Analysis System

Model：PHS-100D      Country of Origin：China      Category：Device junction temperature simulator Tj

Overview：The PHS-100D compact power semiconductor temperature control test system is a miniaturized, high-precision, fanless temperature control system, optimized for static parameter, dynamic characteristic, and reliability testing of power semiconductors (IGBT, SiC, GaN). It uses low-voltage power supply and a patented structure, along with effective high-temperature protection, to ensure the safety of devices and personnel.

PHS-500 Series Expert-Grade High-Low Temperature Wide Temperature Range Junction Temperature Simulation System

Model：PHS-500      Country of Origin：China      Category：Device junction temperature simulator Tj

Overview：The PHS-500 is an expert-grade high/low temperature junction temperature simulation system suitable for everything from wafers to packaged modules. Its fanless design achieves rapid high/low temperature changes while ensuring temperature stability.

PHS-200 Series Dual-Channel SiC-GaN Professional-Grade Device / Module Universal Fanless Junction Temperature Simulation System

Model：PHS-200      Country of Origin：China      Category：Device junction temperature simulator Tj

Overview：PHS-200 is a professional forced-air-free junction temperature simulation system that is compatible with both packaged power devices and packaged power modules for junction temperature control. It can be combined with IWATSU's CS series and Keysight's power device analyzers to form a power device analysis system, completing datasheet calibration testing of power devices with one click.

PHS-500 TO Package SiC Power Discrete Device Temperature @ Electrical Parameter Automatic Test System, Jiechuang Self-Developed

Model：PHS-500      Country of Origin：China      Category：Semiconductor Parameter Analyzer

Overview：Precise 175°C high-temperature control, automatic static parameter testing, one-click generation of professional Datasheet reports, and full-process assurance of test safety. The system complies with test standards such as AEC-Q101/AQG-324. Under temperature variation: ★BVces, ★ICES, ★IGES, ★VCE(sat)/RDS(on), ★VGE(th), ★Transfer, ★Output, ★Vsd/Is, etc.

Easycon 201S multi-channel SMU source measure unit system software, independently developed by Jiechuang

Model：EC-201      Country of Origin：China      Category：SMU Source Measure Unit

Overview：EasyCon-201 is a parameter test and analysis software designed for multi-channel SMU source meter application scenarios, targeting two-terminal, three-terminal, and four-terminal devices and materials, customizable for different research needs.

Easycon 200X semiconductor parameter analysis software system

Model：Easycon 200X       Country of Origin：China      Category：Customizable System Integration Software

Overview：Independently developed by JECTRONIC, this is a highly integrated platform software for comprehensive semiconductor parameter applications such as IWATSU semiconductor parameter analyzers, KEITHLEY source measure units, and Lianxun source measure units, and can be extended with high/low temperature control, temperature control, optical, and other peripherals.

Jiechuang self-developed PD-200X multi-purpose double-pulse (DPT) device dynamic parameter analysis system

Model：PD-200X      Country of Origin：China      Category：Dynamic Parameter Test System

Overview：The PD-200X is a multi-purpose power device dynamic parameter test and analysis system deeply developed by JECTRONIC. The system adopts a minimum loop structure to ensure system Ls<20nH, modular equipment, excellent instrument and probe compatibility, and high-redundancy safety to ensure the safety of devices and personnel during high-voltage and high-current testing. It is currently the most cost-effective double-pulse test system, particularly suitable for universities, research institutes, and startup semiconductor companies.