PRECISE HCP Series Source Measure Units HCP100/HCP200/HCP300 High-Voltage Benchtop Pulsed Source Measure Units Precis
Model:HCP100/HCP200/HCP300 Country of Origin:China Category:SMU Source Measure Unit
Overview:Characteristic testing of nanomaterials: graphene, nanowires; characteristic testing of organic materials: e-ink, printed electronics technology; energy and efficiency characteristic testing: LED/AMOLED, solar cells, batteries, DC-DC converters; characteristic testing of discrete semiconductor devices: resistors, diodes, light-emitting diodes, Zener diodes, PIN diodes, BJT transistors, MOSFETs, SiC, etc.; sensor testing: resistivity, Hall effect