IWATSU Semiconductor Parameter Automated Measurement Software CS-810

Automate measurements and boost efficiency!
Semiconductor Parameter Measurement Software CS-810

In many past projects, setup was performed manually and then a great deal of time was spent carrying out measurements. With the IWATSU Semiconductor Parameter Measurement Software CS-810, measurements can be performed easily and automatically,and test conditions and results can be saved as records.

Benefits of Adoption

• Programmable measurement steps ensure reliable, thorough measurement with no omissions

• Supports data storage and recall, so test conditions and results can be saved as records

• Supports automatic PASS/FAIL judgment for sorting

• Control of some optional accessories can also be automated (e.g., temperature control of a hot plate)

• Significantly improves efficiency in high-temperature applications 

Actual comparison performed (company comparison)

Automatic measurement using the same samples (Semiconductor Parameter Measurement Software CS-810) was compared with conventional manual measurement.

• Manual measurement times are assumed to be those of an experienced operator.

The software option installed on a PC controls curve tracers, scanners, hot plates, and other equipment via Ethernet.

Simple configuration enables the curve tracer to automatically perform measurements that until now required manual operation, improving work efficiency.

No programming knowledge required

Import manual curve tracer measurement settings into a PC, and anyone can configure them easily—no programming knowledge needed.

Automatic measurement (leakage current, saturation voltage, VF, Vth, etc.)

Measurement Result Window

Waveform Comparison Function

Compare waveforms saved after measurement against design-time deviations or failure analysis data. Waveform comparison can also be used for pass/fail judgment.

Waveform Comparison and Judgment

Pass/fail judgment can be performed by comparing against reference data.

Waveform Display

Display and compare up to 10 waveforms simultaneously on the same graph, including previously acquired CSV files, recalled waveforms from the curve tracer, and currently acquired waveforms.

Rescaling Function

Save the voltage axis of the displayed waveform to a CSV file at arbitrary intervals. This allows the voltage axis to be aligned when tabulating measurement results.

Cursor Function

Displays the values of the waveform in a table. Values at points other than sampling points can also be shown via interpolation.

Annotation Display

Displays, edits, and moves annotations for each waveform.

Saving Chart Images

Charts, file lists, and cursor values can be combined freely and saved as image files.
(Image formats: PNG/BMP/JPG/TIFF)

Multiple Chart Displays

--Configurable Items--

Chart title, chart area background color, cursor color, Line Dot (lines only, dots only, lines and dots); X-axis, Y-axis: axis title, data selection (Ic/Vce/Vbe), scale (Log/Linear) (Y-axis only), tick interval (Auto, 1-2-5 Step), minimum and maximum tick values, grid (display color, show/hide)

Automatic Transfer Characteristic Measurement

Transfer characteristics can be measured automatically using the curve tracer.

Saving Characteristic Curve Data

Save measured characteristics as CSV files and charts as image files.
*Image formats: PNG/BMP/JPG/TIFF

Cursor Function

Cursors are displayed on the X and Y axes. Values between measurement data points are displayed by interpolation.

Chart area customization

Customize chart titles, axis labels, background colors, axis ranges, and more.

Saving/loading settings

Save characteristic measurement settings and chart area customization settings to a file, and load them back from a file.

Device testing

Efficiently test and record multiple devices in a short time.
Automatically execute multiple measurement items.
Operators simply follow the on-screen prompts to swap devices, rewire, or enter a sample name as needed (with automatic sample-name entry), enabling repeated measurements under identical conditions.
Judgment results are displayed for each measurement, and image and waveform data are saved automatically.

After entering the sample name, set it as the test bench

Display measured values and judgment results during measurement

Pop up pause and work instructions based on the judgment result

Pauses and work instructions pop up according to the measurement item

After measurement, log files can be exported as CSV or worksheet format.
Waveform images and data are saved automatically during measurement.
Stress test logs are saved to a separate file.
You can select a measurement result from the log display and re-run the measurement.

Module measurement

Controls the scanning system together with the curve tracer.
It also controls open/short and HV/HC switching for each device gate, enabling fully automated measurement of a single module without removing the busbar.

When configuring the CS-810, simply set up one device and copy it to the required number of devices to complete setup with ease.

• The gate of an untested device can be shorted to the emitter (CS-707).

Saving characteristic curve files

Save measured characteristics as CSV files and charts as image files.
*Image formats: PNG/BMP/JPG/TIFF

Cursor function

Cursors are displayed on the X and Y axes. Values between measurement data points are displayed by interpolation.

Customizing the chart area

Chart titles, axis labels, background colors, axis ranges, and more can be customized.

Saving/Loading Settings

Characteristic measurement settings and chart area customization settings can be saved to and loaded from files.

Semiconductor Temperature Characteristic Evaluation

The CS-810 can also control a hot plate simultaneously.
Fully automated measurement is available for time-consuming temperature parameter runs.

Stress Testing

Program various parameters into stress tests

• Enables long-duration reliability testing.

• Current and voltage are continuously monitored automatically by the curve tracer, with changes in both recorded simultaneously.

• Parameters can be measured automatically before, during, or after stress testing.

• Lower and upper limits are set for both current and voltage; application stops as soon as a limit is exceeded.

Maintains a constant voltage or current (10 seconds to 1,000 hours)
Measures Ic and Vce (interval: 10 seconds to 2 hours)

Discrete device testing

Connect and measure multiple devices with a single click

Identical units can be measured sequentially. The CS-700 series scanning system offers 10 channels. Automates measurement of 10 elements, including time-consuming temperature characteristics. With CS-810 control software, setup is completed by simply copying one element.

Up to 10 CS-700 series systems can be operated in parallel

Supports wafer measurement

Measure devices on wafers by connecting to a probe station system
Probe station connection cable CS-306/308
Cable for connecting a probe station to a curve tracer (equipped with dedicated interlock terminals)