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Tektronix-Keithley Keithley Semiconductor Parameter Automated Characterization Suite (ACS) Software

Tektronix-Keithley Keithley Semiconductor Parameter Automated Characterization Suite (ACS) Software

Model:ACS      Country of Origin:USA

Category:Semiconductor Parameter Analyzer

Overview:

Keithley Automated Characterization Suite (ACS) Software

The Keithley Automated Characterization Suite (ACS) is a flexible, interactive software test environment for device characterization, parametric testing, reliability testing, and even simple functional testing. ACS supports a wide range of Keithley instruments and systems, hardware configurations, and test setups—from a few benchtop instruments in a QA lab to fully integrated, rack-based automated test systems. With ACS, users can configure instruments using automated hardware management tools and quickly run tests without programming knowledge.

Features
Specifications
Application Notes
Functions & Configuration



Share test projects and results

ACS provides a common set of key elements that work across multiple hardware configurations, reducing time and increasing productivity. Execution is consistent from one hardware implementation to another, so it is easy, for example, to transfer your test results from a basic ACS system for single-device component characterization to another system designed for wafer-level testing.

Maximize the productivity of your Keithley hardware

The tools in ACS streamline test development and maximize the speed of every Keithley instrument connected to your system. Together, ACS and Keithley TSP-based hardware deliver exceptionally high throughput, lowering your cost of test—without requiring you to learn new programming concepts or languages before you can get the data you need.

ACS and Keithley TSP-based hardware

Supported instruments

Instrument typeModelACS version

6200 series, 2182AACS Basic
ACS Standard
SMU Instruments2600B Series:2601B, 2602B, 2604B, 2611B, 2612B, 2614B, 2634B, 2635B, 2636B
2600A Series: 2601A, 2602A, 2611A, 2612A, 2635A, 2636A
2400 Graphical Touchscreen Series:2450, 2460, 2460-NFP, 2460-NFP-RACK, 2460-RACK, 2461, 2461-SYS, 2470
2400 Standard Series:2401, 2410, 2420, 2430, 2440
2606B High-Density Series:2606B
2650 Series for High Power:2651A, 2657A
ACS Basic
ACS Standard
Parameter Analyzers4200AACS Basic
ACS Standard
DMMDMM7510, DMM6500, 2010 SeriesACS Basic
ACS Standard
Switching Systems707A/B, 708A/B, 3700AACS Basic Edition
ACS Standard Edition
Pulse Generators3400 SeriesACS Basic Edition
ACS Standard Edition
Probe StationsTEL P8/P12, TEL T78S/80S, ACCRETECH (Tokyo Seimitsu) TSK9/UF200/UF3000/APM60/70/80/90, MPI SENTIO TS2000/TS2000-SE/TS2000-HP/TS3000, FormFactor (Cascade) Summit 12000, FormFactor (Cascade) S300, Suss MicroTec PA200/Cascade CM300, Electroglas EG2X/EG4X, Wentworth Pegasus 300S, Signatone CM500, Yang Sagi3, Micromanipulator P300A,  Vector Semiconductor AX/VX Series, Apolowave AP200/AP300, MJC AP-80, Semiprobe SPFA Prober,  HiSOLACS Standard Edition

Note:

  1. ITM supports 24xx TTI instruments, 26xx instruments, and mixed use cases.

  2. Users can control any TSP instrument via STM scripts. The existing ACS STM libraries support the specific instruments defined in each library.

  3. Users can control any instrument via PTM scripts. The existing ACS PTM libraries support the specific instruments defined in each library.


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