Model：B1500A Country of Origin：USA
Category：Semiconductor Parameter Analyzer
The Keysight B1500A Semiconductor Device Parameter Analyzer is a comprehensive device characterization solution that integrates a wide range of measurement capabilities, including IV, CV, and fast pulsed IV, with exceptionally high measurement reliability.
It features an intuitive 15-inch touchscreen interface, enabling data analysis without the need for an external PC.
A single B1500A mainframe offers up to 10 slots, giving you the flexibility to configure it with the measurement modules of your choice.
With the intuitive Keysight EasyEXPERT software, you can take full advantage of the 15-inch wide touchscreen.
Switch quickly between CV and IV measurements without reconnecting cables.
Capture ultra-fast transients that conventional test instruments cannot.
Measure multi-frequency AC capacitance from 1 kHz to 5 MHz.
Configure up to 10 interchangeable modules to meet a wide range of test requirements, including SMUs, C-V meters, waveform generators, and switching matrices.
Precisely characterize devices from sub-femtoamp leakage currents to kilovolt-class power switches, supporting everything from low-power research to advanced semiconductor testing.
As your requirements grow, test coverage can be easily expanded by adding higher-power modules, pulsed measurement units, or switching capabilities—without replacing the system.
Simplifies test setup and analysis through a graphical interface featuring a pre-built test library, real-time plotting, and advanced comparison tools.
Configure up to 10 interchangeable modules to meet a wide range of test requirements, including SMUs, C-V meters, waveform generators, and switching matrices.
Precisely characterize devices from sub-femtoamp leakage currents to kilovolt-class power switches, supporting everything from low-power research to advanced semiconductor testing.
As your requirements grow, test coverage can be easily expanded by adding higher-power modules, pulsed measurement units, or switching capabilities—no need to replace the system.
Simplifies test setup and analysis through a graphical interface featuring a pre-built test library, real-time plotting, and advanced comparison tools.
Ready-to-use application library
| Device type | Application testing |
| CMOS transistors | Id-Vg, Id-Vd, Vth, breakdown, capacitance, and QSCV |
| Bipolar transistor | Ic-Vc, diode, Gummel plot, breakdown, and capacitance, etc. |
| Discrete devices | Id-Vg, Id-Vd, Ic-Vc, diode, etc.|
| Memory | 5. Capacitance and endurance testing |
| Power Devices | Pulsed Id-Vg, pulsed Id-Vd, breakdown |
| Nanoscale devices | Resistance, Id-Vg, Id-Vd, Ic-Vc |
| Reliability Testing | NBTI/PBTI, charge pumping, electromigration, hot carrier injection, J-Ramp, TDDB, and more
EasyEXPERT delivers powerful capabilities
| Measurement capabilities | Staircase sweep, multi-channel sweep, pulsed sweep, I-V sampling, high-speed I-V sampling, C-V, C-t, C-f, etc. |
| Switch Matrix Control | Supports B2200, B2201, and E5250 (E5252 card). |
| Analysis and data display functions | List display, X-Y plots (including cursors, markers, and lines), automatic analysis functions, user-defined functions, etc. |
| Data Management | User workspace management; the auto-record function lets you save/recall measurement data and settings |
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TEL: 0731-85260926
Fax: 0731-85263946
E-mail: sales@jectronic.com
Address: Room 1015, Building A3, Changsha Yu Center, No. 289 Huanbao Middle Road, Yuhua District, Changsha City
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