PRECISE CS Series Source Measure Unit CS100/CS200/CS300/CS400/CBI401 and CBI402 Sub-Cards Precisely

Product Features:

Pss card-based instruments offer high channel density, powerful synchronized triggering, and efficient multi-instrument combination. The Pss card-based mainframe uses a proprietary architecture with a backplane bus bandwidth of up to 3 Gbps and a 16-line trigger bus, meeting the high-speed communication requirements of multi-card configurations. Pss has developed a broad range of optional daughter cards, allowing users to flexibly configure cards according to their functional and performance needs. External communication is supported via serial, Ethernet, and GPIB.

To meet varying requirements for card slot count, two mainframes are offered: the 1003C and the 1010C. The 1003C provides 3 card slots, while the 1010C provides 10. All Pss daughter cards are compatible with both mainframes.

The CS series source-measure daughter cards are high-precision, wide-dynamic-range card-based source measure units developed by Pss over many years. Integrating voltage and current sourcing, sinking, and measurement functions, they support four-quadrant operation and are therefore widely used in a variety of semiconductor electrical characterization tests.The CS series suits users across industries and is particularly well suited for characterization of modern semiconductors, nanodevices and materials, organic semiconductors, printed electronics, and other small-size, low-power devices.

Daughter cards currently available include the CS100, CS200, CS300, CS400, CBI401, and CBI402. The CS100, CS200, and CS300 are single-channel cards; the CS400, CBI401, and CBI402 are four-channel cards with a common ground across the four channels. With the 10-slot mainframe, users can configure up to 40 channels and select different daughter cards to achieve the optimal cost-performance balance for their application.

Applications:

Characterization of nanomaterials, including graphene and nanowires

Characterization of organic materials, including e-ink and printed electronics

Energy and efficiency characterization, including LED/AMOLED, solar cells, batteries, and DC-DC converters

Characterization of discrete semiconductor devices, including resistors, diodes, LEDs, Zener diodes, PIN diodes, BJTs, MOSFETs, and SiC devices

Sensor characterization, including resistivity and Hall effect measurements; aging of low-power VCSELs and butterfly lasers