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PRECISE P Series SMU P100/SMU P200/SMU P300 Pulse Source Measure Unit Precis

PRECISE P Series SMU P100/SMU P200/SMU P300 Pulse Source Measure Unit Precis

Model：SMU P100、SMU P200、SMU P300 Country of Origin：China

Category：SMU Source Measure Unit

Overview：

The P Series pulsed source-measure unit (SMU) is a new high-precision, wide-dynamic-range digital touchscreen SMU built on our DC SMU platform. It combines voltage and current sourcing, sinking, and measurement in a single instrument, with up to 300 V output voltage and up to 10 A pulsed output current, and supports four-quadrant operation—making it suitable for a wide range of electrical characterization tests. The P Series is designed for users across industries and is particularly well suited to characterization and analysis of modern semiconductors, nanoscale devices and materials, organic semiconductors, printed electronics, and other small-scale, low-power devices.

Features

Specifications

Application Notes

Functions & Configuration

Key Features:

5-inch touchscreen with fully graphical operation

Built-in powerful software speeds up testing, such as LIV and PIV; source and measurement accuracy of 0.1%, 5.5-digit resolution

Four-quadrant operation (source and sink) with wider source and measurement ranges: current down to 1 pA, voltage up to 300 V

Versatile sweep modes supporting linear, exponential, and user-defined sweeps; USB storage for one-click test report export

Multiple communication interfaces: RS-232, GPIB, and LAN

Minimum pulse width of 200 µs

Applications:

Characterization of nanomaterials such as graphene and nanowires

Characterization of organic materials such as e-ink and printed electronics

Energy and efficiency characterization of LEDs/AMOLEDs, solar cells, batteries, DC-DC converters, and more

Characterization of discrete semiconductor devices including resistors, diodes, LEDs, Zener diodes, PIN diodes, BJTs, MOSFETs, and SiC devices

Sensor characterization such as resistivity and Hall effect measurements

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