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Keithley SMU2650 Series 2651A/26527A High-Power SourceMeter® Tektronix USA TEKTRONIX

Keithley SMU2650 Series 2651A/26527A High-Power SourceMeter® Tektronix USA TEKTRONIX

Model:2651A/26527A      Country of Origin:China

Category:SMU Source Measure Unit

Overview:

The 2650 Series High Power SourceMeter SMU instruments are designed for characterization and testing of high voltage/current electronics and power semiconductor components, including diodes, FETs and IGBTs, high-brightness LEDs, DC-to-DC converters, batteries, solar cells, and other high-power materials, components, modules, and subassemblies. They deliver unprecedented power, precision, speed, flexibility, and ease of use to boost efficiency in R&D, production testing, and reliability environments. Two instruments can supply up to 3000V or up to 2000W of pulsed current power.

Features
Specifications
Application Notes
Functions & Configuration

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Features

Advantages

Highly flexible four-quadrant voltage and current source/load, coupled with high-precision voltmeters and ammeters

Delivers performance that outclasses comparable products, with 6½ -digit resolution.  

Source or sink (2651A) Pulse power up to 2000 W(±40 V, ±50 A), or DC power up to 200 W(±10 V @ ±20 A, ±20 V @ ±10 A, ±40 V @ ±5 A); easily connect two units (in series or parallel) to create solutions up to ±100 A or ±80 V

Supports characterization and testing of power semiconductors, HBLEDs, optical devices, solar cells, GaN, SiCand other compound materials and devices/. Applications include semiconductor junction temperature characterization; high-speed, high-precision digitization; electromigration studies; and high-current, high-power device testing.

Source or sink (2657A) DC or pulsed power up to 180W(±3000V@20mA, ±1500V@120mA)

Delivers the high voltage needed for power semiconductor device characterization and testing, including GaN, SiC and other compound materials and devices, fault and leakage testing up to 3 kV , and sub-millisecond transient characterization.

Built-in web-browser-based software

enables remote control from anywhere in the world, on any computer, through any browser.

Selectable digital or integrating measurement modes

support accurate characterization of transient and steady-state behavior, including fast-changing thermal effects.

TSP(Test Script Processing) technology

integrates easily with the 2657A and 2600B series models.

TSP-Link channel expansion bus

Combine multiple 2651Aand 2657Aunits with selected 2600BSeriesSMUinstruments into an integrated system of up to 32channels.

Compatible with the 8010High Power Device Test Fixture and the 8020High Power Interface Panel

to provide safe, convenient connections for packaged-part or wafer-level high power device testing.

Free test script builder software tool

Create, modify, debug, and store TSPtest scripts.

The optional ACSbasic semiconductor component characterization software

maximizes efficiency when performing packaged-part characterization during development, quality inspection, or failure analysis.


Model

Channel

Maximum current source/Range

Maximum voltage source/Range

Measurement resolution (current/Voltage)

Power supply

2651A

1

50A

40V

100fA / 100nV

2000 W

2657A

1

120mA

3000V

1fA / 100nV

180 W


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