Quick Contact>

Hotline

0731-85260926 18665876229

中文
Power Transistor Curve Tracer Semiconductor Parameter Analyzer SMU Source Measure Unit Dynamic Parameter Test System CV Parameter Tester Gate Charge (Qg) Tester WAT Wafer Acceptance Test System TLP Transmission Line Pulse EMMI Low-Light Infrared Fault Localization HCI/BTI/TDDB/EM effects Femtoammeter/Electrometer/High Resistance Meter High and low temperature electrical performance simulation H3TRx Customizable System Integration Software
Standard Manual Probe Station Portable Desktop Probe Station Semi-automatic probe station RF/Microwave Probe Station High/Low Temperature Probe Station Vacuum cryogenic probe station system Wafer electrical parameter test system Strong Magnetic - Hall Probe Station Custom Precision Probe Card High/Low Temperature Chuck System (Taiko) Magnetic Probe Holder CCD Microscope Test cables and adapter fixtures Shielded Box and Vibration Isolation Table Probes and other accessories
B-H Analyzer Magnetic Loss Power Tester Impedance Analyzer DC Bias High-Frequency LCR Meter Vector Network Analyzer VNA Frequency Response Analyzer Milliohm Meter / Battery Internal Resistance Tester
Rapid Temperature Change Thermal Flow Meter Device High/Low Temperature Platform Thermalplate Device junction temperature simulator Tj
12-bit high-definition digital oscilloscope Optically Isolated Oscilloscope System Basic Digital Oscilloscope Signal generator Digital Multimeter DMM Spectrum Analyzer Frequency counter Infrared thermal imager
Optically isolated voltage probe Optically Isolated Current Probe Dynamic On-Resistance Rds(on)dynamic Oscilloscope voltage probe High-voltage differential probe Fluxgate current transformer AC/DC Current Probe Non-inductive coaxial shunt Communication Interfaces and Cables Dedicated fixture Software
Multi-channel data acquisition instrument Data Acquisition and Playback Power Analyzer
Digital Phase-Locked Loop Amplifier Ultra-Low Noise Preamplifier Precision Current Amplifier Precision Differential Amplifier Precision Filter Light chopper Precision Low-Noise DC Power Supply
Programmable DC Power Supply DC Electronic Load Precision Bipolar Power Amplifier Bipolar simulation power supply
Safety Tester (ACI/DCI/IR/GB) High-voltage meter HV meter
Standard or calibration source meter Standard current and voltage meters
Products
Lianxun Instruments S2012C Single-Channel PXIe Plug-in Source Measure Unit Precision Power/Measurement Unit ±200 V, ±1 A (DC), ±3 A (pulse)

Lianxun Instruments S2012C Single-Channel PXIe Plug-in Source Measure Unit Precision Power/Measurement Unit ±200 V, ±1 A (DC), ±3 A (pulse)

Model:S2012C      Country of Origin:China

Category:SMU Source Measure Unit

Overview:

Semight S2012C A compact, cost-effective single-channel PXIe source/measure unit (SMU) that simultaneously sources and measures voltage and current. It delivers up to ±200 V, ±1 A (DC), ±3 A (pulsed), and 20 W of constant power, supports standard SMU SCPI commands for easy, fast migration of test code, and is compatible with mainstream PXIe chassis. Multi-card synchronization is supported, enabling integration into production test systems to boost test throughput and reduce cost.

Features
Specifications
Application Notes
Functions & Configuration

Key Features

  • High Precision

    Resolution down to 10 fA/100 nV,
    voltage accuracy of 100 μV,
    current accuracy of 9 pA
  • Wide Range, High-Speed Measurement

    ±200 V, ±1 A (DC),
    ±3 A (pulse);
    sampling rates up to 1 MS/s
  • Adaptive PFC System

    With the Adaptive PFC
    (Precise-Fast Control) system,
    users can adjust relevant parameters based on load characteristics
  • Build a multi-channel parallel test system

    Based on a standard PXIe chassis,
    easily achieve multi-channel parallel testing

Features and Benefits

  • 5 functions in one

    Voltage source
    Current source
    Ammeter
    Voltmeter
    Electronic load
  • Quadrants I and III operate as a source: the actual polarity of the V/I output follows the source setting;
    Quadrants II and IV operate as a load: CC and CV work together; when used as a load, the load setting polarity is opposite to the source polarity;
  • Capable of testing a wide range of devices

  • Capture more measurement data

    ♦ 6.5-digit resolution: accuracy comparable to a 6.5-digit digital multimeter;
    ♦ 10 fA / 100 nV resolution: excellent sensitivity for both sourcing and measurement;
    ♦ 1 M points/s: high-speed measurement with fast setup and digitizing rates for arbitrary waveform generation and list sweeps;
  • Extensive sweep capabilities

  • DC I-V output capability

  • Pulsed I-V output capability


Voltage specifications


Voltage accuracy

Range

Setting resolution

Accuracy (1 year)

±(% reading + offset) 【1】

Typical noise (RMS)

0.1 Hz-10 Hz

±200 V【2】

100 μV

0.03% + 10 mV

0.4 mV

±20 V

10 μV

0.03% + 1 mV

50 μV

±6 V

1 μV

0.03% + 0.4 mV

12 μV

±0.6 V

100 nV

0.03% + 100 μV

3 μV

Temperature coefficient

±(0.15×accuracy specification)/℃ (0℃-18℃, 28℃-50℃)

Overshoot

<±0.1% (typical, Normal, step from 10% to 90% of range, full-scale point, resistive load test)

Noise

10Hz-20MHz

<5 mVrms, 20 V voltage source, 1 A resistive load


[1] Accuracy calculation example: to test the accuracy of a 120 mV output on the 600 mV range, the tolerance is:

[2] This instrument has potentially hazardous high voltage (±210 V) output to the HI /Sense HI/Guard terminals. To prevent electric shock, relevant safety precautions must be taken before powering on. Do not connect the Guard terminal to any output, including shorting it to chassis ground or output LO, otherwise the instrument will be damaged


Current specifications


Current accuracy

Range

Setting resolution

Accuracy (1 year)

±(% reading + offset)

Typical noise (RMS)

0.1Hz-10Hz

±3 A【3】

1 μA

0.03% + 2 mA

40 μA

±1 A

100 nA

0.03% + 90 μA

7 μA

±100 mA

10 nA

0.03% + 9 μA

600 nA

±10 mA

1 nA

0.03% + 900 nA

60 nA

±1 mA

100 pA

0.03% + 90 nA

6 nA

±100 μA

10 pA

0.03% + 9 nA

700 pA

±10 μA

1 pA

0.03% + 1 nA

80 pA

±1 μA【4】

100 fA

0.03% + 200 pA

20 pA

±100 nA【4】【5】

100 fA

0.06% + 30 pA

3 pA

±10 nA【4】【5】

10 fA

0.06% + 9 pA

600 fA

Temperature coefficient

±(0.15×accuracy specification)/℃ (0℃-18℃, 28℃-50℃)

Overshoot

<±0.1% (typical, Normal, step from 10% to 90% of range, full-scale point, resistive load test)


[3] The 3 A range supports pulse mode only; accuracy is typical.

[4] For weak low-current measurement, it is recommended to keep using triaxial cable connection; if a triaxial terminal is used to convert to ordinary wiring output, the current accuracy of the instrument will be affected.

[5] Additional specification conditions: NPLC set to 10 PLC

Pulse source specifications (4-wire)

Minimum programmable pulse width100 μs
Pulse width programming resolution1 μs
Pulse width programming accuracy±10 μs
Pulse width jitter

2 μs

Pulse width definitionAs shown in the figure below, the time from the 10% leading edge to the 90% trailing edge





Pulse specificationsMaximum current limitMaximum pulse widthMaximum duty cycle
10.1 A/200 VDC, unlimited100%
21 A/20 VDC, unlimited100%
43 A/66. 6V1 ms5%
53 A/160 V

400 μs

2%


Looking for more sales, technical and solutions information?

Contact Us >

Leave a Message

Hotline

0731-8526092618665876229

We will get back to you as soon as possible. Thank you!
(Jectronic handles your information with care. By submitting, you confirm that you have read and agree to the personal information transfer statement of this website.)

Inquiry Type: Message