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Easycon 201S multi-channel SMU source measure unit system software, independently developed by Jiechuang

Easycon 201S multi-channel SMU source measure unit system software, independently developed by Jiechuang

Model:EC-201      Country of Origin:China

Category:SMU Source Measure Unit

Overview:

EasyCon-201 is a parameter test and analysis software designed for multi-channel SMU source meter application scenarios, targeting two-terminal, three-terminal, and four-terminal devices and materials, customizable for different research needs.

Features
Specifications
Application Notes
Functions & Configuration

EC-201 is a customizable parameter analysis and test software designed formulti-channel SMUsource-measure applications intwo-, three-, and four-terminal device and material research, adaptable to a range of requirements.

It supportsfour-wire measurementandfour-point-probe resistance measurement, as well aspulsed I-VandDC I-Vtesting.

It can be combined withinstruments from variousfields to form an integrated test system

(for example, pairing with a Raman spectrometer for synchronized electrical-optical testing with result output, or with a hot plate for optoelectronic device performance testing at different temperatures).

It can store up to10different test conditions simultaneously andstart automated sequential testing with a single click.

Together with shielded test enclosures such asHSF-200 and HSF-100, it enables a complete multi-channel SMU test system for customers, delivering safe and accurate test parameters and data analysis.




Can build for customersMulti-channel SMU test system, and enable safe and accurate testing and data analysis of parameters for materials and semiconductor devices across various fields.

Freely select the number of SMU channels, up toExpand to 10 channels。

Software built-inData analysis and scientific computingfeatures, helping researchers obtain desired results more conveniently.

Start testing with simple connection and configuration,Graphical UINo learning curve.

Can be combined with instruments from various fields to form a comprehensive test system (e.g., paired with a spectrometer for synchronized electrical and optical testing with result output)


Two-dimensional electronic devices, two-dimensional materials, optoelectronic devices, next-generation semiconductors, memristors, flexible electronics, and other fields

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