Quick Contact>

Hotline

0731-85260926 18665876229

Technical Support

Get a Quote

Product Inquiry

Feedback

中文

Power Transistor Curve Tracer Semiconductor Parameter Analyzer SMU Source Measure Unit Dynamic Parameter Test System CV Parameter Tester Gate Charge (Qg) Tester WAT Wafer Acceptance Test System TLP Transmission Line Pulse EMMI Low-Light Infrared Fault Localization HCI/BTI/TDDB/EM effects Femtoammeter/Electrometer/High Resistance Meter High and low temperature electrical performance simulation H3TRx Customizable System Integration Software

Standard Manual Probe Station Portable Desktop Probe Station Semi-automatic probe station RF/Microwave Probe Station High/Low Temperature Probe Station Vacuum cryogenic probe station system Wafer electrical parameter test system Strong Magnetic - Hall Probe Station Custom Precision Probe Card High/Low Temperature Chuck System (Taiko) Magnetic Probe Holder CCD Microscope Test cables and adapter fixtures Shielded Box and Vibration Isolation Table Probes and other accessories

B-H Analyzer Magnetic Loss Power Tester Impedance Analyzer DC Bias High-Frequency LCR Meter Vector Network Analyzer VNA Frequency Response Analyzer Milliohm Meter / Battery Internal Resistance Tester

Rapid Temperature Change Thermal Flow Meter Device High/Low Temperature Platform Thermalplate Device junction temperature simulator Tj

12-bit high-definition digital oscilloscope Optically Isolated Oscilloscope System Basic Digital Oscilloscope Signal generator Digital Multimeter DMM Spectrum Analyzer Frequency counter Infrared thermal imager

Optically isolated voltage probe Optically Isolated Current Probe Dynamic On-Resistance Rds(on)dynamic Oscilloscope voltage probe High-voltage differential probe Fluxgate current transformer AC/DC Current Probe Non-inductive coaxial shunt Communication Interfaces and Cables Dedicated fixture Software

Multi-channel data acquisition instrument Data Acquisition and Playback Power Analyzer

Digital Phase-Locked Loop Amplifier Ultra-Low Noise Preamplifier Precision Current Amplifier Precision Differential Amplifier Precision Filter Light chopper Precision Low-Noise DC Power Supply

Programmable DC Power Supply DC Electronic Load Precision Bipolar Power Amplifier Bipolar simulation power supply

Safety Tester (ACI/DCI/IR/GB) High-voltage meter HV meter

Standard or calibration source meter Standard current and voltage meters

Products

Product information

You are here: Home > Products > Magnetic Materials and Device Analysis > B-H Analyzer

Products

IWATSU SY-320A/321A Iwasaki SY-8218 B-H analyzer magnetic core high/low temperature test system

IWATSU SY-320A/321A Iwasaki SY-8218 B-H analyzer magnetic core high/low temperature test system

Model：SY-320A/321A Country of Origin：Japan

Category：B-H Analyzer

Overview：

IWATSU has partnered with ESPEC, a globally renowned thermal chamber manufacturer, to develop an automated constant-temperature B-H test system for high/low-temperature multi-sample automated testing of soft magnetic products

Downloads

IWATSU SY-956 High-Frequency Soft Magnetic Parameter B-H Analyzer for Amorphous Ribbon

IWATSU B-H ANALYZER S8218,SY8219 DATASHEET VER.2021

Features

Specifications

Application Notes

Functions & Configuration

B-H Analyzer - Temperature scanner system

Temperature range : -30°C to 150°C, Sample 41pcs, max.
		Test freq. : 10Hz～5MHz (with SY-8218 mainframe) : 10Hz～1MHz (with SY-8219 mainframe) Input current : ±6A, max. Input Voltage : ±200V, max. Temp. range : －30°C to 150°C

Specifications

Remote control system configurations

REMOTE CONTROL SOFTWARE : SY-810

Spare parts for temperature scanner system

	Turntable (for setting samples on scanner mechanism) SY-510(for SY-320A) SY-511(for SY-321A)
	Spare connection pin set SY-512(for SY-320A/321A)

Specifications

Item		SY-320A	SY-321A
Scanner chamber unit	Input voltage	AC100V 50 / 60Hz
	Input current	12.5A, max.	21.0A, max.
	Temperatur erange	-30°C to +150°C
Scanner mechanismunit	Inputpower	AC100V to 120V,50/60Hz
	Power consumption	28VA
	Test frequency range	10Hz to 5MHz with SY-8218 10Hz to 1MHz with SY-8219
	Samples	20pcs.,max.	41pcs., max.
	Input current	±6A, max.
	Input voltage	±200V,max.
Dimensions (mm) Weight		Approx. 543Wx695Lx620H Approx. 85kg	Approx. 640Wx920Lx660H Approx. 135kg
Accessories		Reference sample, Chamber cable(SY901),Turn table, GPIB cable(1meter), Power cable, Operation manual SY-510(SY-320A) or SY-511(SY-321A)

Looking for more sales, technical and solutions information?

IWATSU (Japan) - PMK, Germany - N4LN4L- USA T&M - Japan APOLLOWAVE - Germany DR HUBERT China General Agent

B-H Analyzer|Semiconductor Curve Tracer|Probe Station-Probe Card|Silicon Carbide Double Pulse|Optically Isolated Probe|UHV Floating|PSM3750 Frequency Response|Rogowski Current Coil|PMK High-Voltage Differential Probe|Piezoelectric Ultrasonic High-Frequency Power Amplifier

Leave a Message

Hotline

0731-8526092618665876229

We will get back to you as soon as possible. Thank you!
(Jectronic handles your information with care. By submitting, you confirm that you have read and agree to the personal information transfer statement of this website.)

Inquiry Type: Message