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Products
NF LP6016-01 Circuit Design Precision Low-Noise DC Voltage Source

NF LP6016-01 Circuit Design Precision Low-Noise DC Voltage Source

Model:LP6016-01      Country of Origin:Japan

Category:Precision Low-Noise DC Power Supply

Overview:

Bias and control voltage sources for sensors and devices, ultra-precision stabilized DC power supplies.

Features
Specifications
Application Notes
Functions & Configuration

Bias and control voltage sources for sensors and devices

lp6016_01

▲ LP6016-01




lp6016_01

The DC voltage source features low noise and high stability. In addition, LAN, USB and RS-232 communication interfaces are standard. Output noise voltage is up to 10 μVrms, and output temperature stability is less than ±10 ppm/°C.
The LP6016-01 is recommended for various high-precision test applications.




Externally controllable  Available for system integration 

2U, half-rack size


Output noise: 10 μVrms     Bandwidth 10 Hz to 20 MHz
Output voltage stability: ±10 ppm/°C typ.
Output voltage: 0 ~ ±16.1 V
Setting resolution: 500 μV
Setting accuracy: ±(0.03%+250 μV)
Output current: 0.1 A max.
External control communication interfaces: USB, RS-232, LAN


graph01


graph02



Front / Rear

front/rear





For embedded requirements


If you are considering embedding it into inspection equipment, please contact us.

Various specifications such as voltage, current, etc. can be customized.
Customization is available based on the embedding environment, including shape, input/output ports, peripheral devices, etc.



Measurement system  -Voltage source for control equipment, bias voltage source for sensors, etc.-


Example: Light-emitting diode

By using it as a bias power supply, the SN ratio of the detection signal is improved.
When detecting the signal of a light-emitting diode, the detection signal varies greatly due to the influence of the bias voltage source.
Using a low-noise bias power supply is extremely important to improve the detection accuracy of small signals (such as biological signals).




Measurement example

Comparison of detection signals with bias voltage applied.


A comparison between a general linear power supply used as a bias voltage source and the LP6016-01 power supply is shown in the following block diagram.


LP6016-01General linear power supply
Real-time waveformimg01img04
Averagingimg02img05
Spectrum observationimg03img06

▲Waveforms can be observed after averaging.▲Even after averaging, due to the influence near the signal frequency
    Due to noise effects, the waveform still cannot be observed 



Measurement block diagram
img07


▼

 As a bias voltage source for highly sensitive sensors, such as magnetic sensors and optical sensors   Improved SN ratio


 Product testing  -Used as control power supply and reference power supply for testing electronic components-


Example: Crystal oscillator

By using it as a control power supply, frequency variation can be reduced.
When evaluating the phase noise, frequency accuracy, frequency stability, etc. of a crystal oscillator, the stability of the control voltage source is a factor affecting the evaluation results.
Therefore, evaluating VCXOs (voltage-controlled crystal oscillators) with a precision power supply is particularly important.




Measurement example

Frequency measurement of VCXO 〜Output frequency comparison via control power supply〜


The charts below show comparison data between a general reference power supply and the LP6016-01 used as a VCXO control voltage source.
※The Δ frequency in the chart represents the difference displayed with the output frequency (approx. 30 MHz) at control voltage Vb = 1.000V as the reference.



LP6016-01General reference voltage source
img01img04
img02img05

▲"LP6016-01" features extremely low noise of 10μVrms, excellent setting accuracy, and a highly stable output voltage.
    Highly suitable for VCXO evaluation.
    In long-term repeated factory testing of control voltages, this relates to yield rate



As a control voltage source for crystal oscillators, semiconductor equipment, electronic components, etc.  
Improve factory test yield rate


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