Quick Contact>

Hotline

0731-85260926 18665876229

中文
Power Transistor Curve Tracer Semiconductor Parameter Analyzer SMU Source Measure Unit Dynamic Parameter Test System CV Parameter Tester Gate Charge (Qg) Tester WAT Wafer Acceptance Test System TLP Transmission Line Pulse EMMI Low-Light Infrared Fault Localization HCI/BTI/TDDB/EM effects Femtoammeter/Electrometer/High Resistance Meter High and low temperature electrical performance simulation H3TRx Customizable System Integration Software
Standard Manual Probe Station Portable Desktop Probe Station Semi-automatic probe station RF/Microwave Probe Station High/Low Temperature Probe Station Vacuum cryogenic probe station system Wafer electrical parameter test system Strong Magnetic - Hall Probe Station Custom Precision Probe Card High/Low Temperature Chuck System (Taiko) Magnetic Probe Holder CCD Microscope Test cables and adapter fixtures Shielded Box and Vibration Isolation Table Probes and other accessories
B-H Analyzer Magnetic Loss Power Tester Impedance Analyzer DC Bias High-Frequency LCR Meter Vector Network Analyzer VNA Frequency Response Analyzer Milliohm Meter / Battery Internal Resistance Tester
Rapid Temperature Change Thermal Flow Meter Device High/Low Temperature Platform Thermalplate Device junction temperature simulator Tj
12-bit high-definition digital oscilloscope Optically Isolated Oscilloscope System Basic Digital Oscilloscope Signal generator Digital Multimeter DMM Spectrum Analyzer Frequency counter Infrared thermal imager
Optically isolated voltage probe Optically Isolated Current Probe Dynamic On-Resistance Rds(on)dynamic Oscilloscope voltage probe High-voltage differential probe Fluxgate current transformer AC/DC Current Probe Non-inductive coaxial shunt Communication Interfaces and Cables Dedicated fixture Software
Multi-channel data acquisition instrument Data Acquisition and Playback Power Analyzer
Digital Phase-Locked Loop Amplifier Ultra-Low Noise Preamplifier Precision Current Amplifier Precision Differential Amplifier Precision Filter Light chopper Precision Low-Noise DC Power Supply
Programmable DC Power Supply DC Electronic Load Precision Bipolar Power Amplifier Bipolar simulation power supply
Safety Tester (ACI/DCI/IR/GB) High-voltage meter HV meter
Standard or calibration source meter Standard current and voltage meters

Products

Product information

Products
Pearson Model 1080 Pearson 200000A 1.5M current sensor test loop transformer probe

Pearson Model 1080 Pearson 200000A 1.5M current sensor test loop transformer probe

Model:1080      Country of Origin:USA

Category:AC/DC Current Probe

Overview:

Pearson Electronics of the United States began designing and producing monitoring transformers in 1958. After decades of development, its products are widely used in U.S. military, medical, aviation and other fields, and have long served in extremely complex transient signal and periodic frequency signal environments, establishing its requirements for precision and high quality. The current test ring, also known domestically as a current transformer or current sensor, operates equivalently to a transformer with its secondary side short-circuited. Ignoring the excitation current, the ampere-turns are equal: I1N1=I2N2. The ratio of the primary winding current I1 to the secondary winding current I2 of the current transformer is called the actual current ratio I1/I2=N2/N1=k.

Features
Specifications
Application Notes
Functions & Configuration

1.jpg2.jpg


Pearson general parameter table.png

Looking for more sales, technical and solutions information?

Contact Us >

Leave a Message

Hotline

0731-8526092618665876229

We will get back to you as soon as possible. Thank you!
(Jectronic handles your information with care. By submitting, you confirm that you have read and agree to the personal information transfer statement of this website.)

Inquiry Type: Message