Micsig SigOFIT Optical Isolated Probe OIP100B, OIP200B, MOIP350P

1. Truest Signal Representation

The SigOFIT optically isolated probe delivers an extremely high common-mode rejection ratio—up to 112 dB at 100 MHz and still 100 dB at 500 MHz—making it the ultimate arbiter of signal fidelity when judging measurements from other voltage probes.

2. Exceptional Measurement Accuracy

As the ultimate arbiter of signal fidelity for other voltage probes, measurement accuracy is a key specification of the SigOFIT optically isolated probe. The SigOFIT offers excellent amplitude-frequency response, DC gain accuracy better than 1%, maximum noise floor of 1.41 mVrms across the full range, and zero drift below 500 μV after warm-up. 

3. The Ideal Test Solution for Third-Generation Semiconductors

Third-generation semiconductor devices have very short turn-on and turn-off times, producing signals with faster rising and falling edges and high-energy high-frequency harmonics. At its maximum bandwidth, the SigOFIT optically isolated probe still maintains a common-mode rejection ratio of nearly 100 dB, virtually eliminating ringing caused by high-frequency common-mode noise. The resulting signal is free of extraneous components, making it the definitive choice for third-generation semiconductor testing.

4. Safe GaN Testing—No Device Failure

The SigOFIT optically isolated probe features short test leads and coaxial transmission, with input capacitance below 3 pF, making gallium nitride (GaN) testing exceptionally safe.

5. Flexible to Use

The SigOFIT optically isolated probe is smaller than conventional high-voltage differential probes, with more compact probe leads for greater flexibility and convenience.

6. Wider Measurement Range

Unlike high-voltage differential probes that can only measure high-voltage signals, the SigOFIT optically isolated probe supports differential-mode signals from ±1.25 V to ±2500 V by pairing with different attenuators, achieving full-scale output and a high signal-to-noise ratio.

7. Efficient and Convenient

The SigOFIT optically isolated probe responds quickly and is ready to measure on power-up, with calibration time under 1 second, ensuring accurate signal output in real time.

8. Application Scenarios

When the accuracy or fidelity of measurements from other voltage probes is in question, the SigOFIT optically isolated probe serves as the final reference.

Power supply evaluation, current shunt measurement, EMI and ESD troubleshooting

Motor drive design, power converter design, electronic ballast design

Design and analysis of GaN, SiC, and IGBT half/full-bridge devices

Safety-isolated testing for high-voltage, high-bandwidth applications

Testing of inverters, UPS, and switching power supplies

Wide-voltage, wide-bandwidth test applications

Various floating measurements

Product specifications table