PHS-500 Power Semiconductor High-Temperature Test System

Integrated solution: semiconductor curve tracer main unit + dedicated high/low temperature fixture + multi-function software

Performance advantages, combining "software and hardware"：

• CS-3000/5000 series stable high-power testing, covering3kV,5KV（15~1500A）

• Micro-current test accuracy up to1pA

• System heating temperature range:RT~175℃

• Test items: IV, Vth, Rds(on), leakage current, etc.

• Compliant with standards: JEDEC, AEC-Q101、AQG-324等

• Fixture design: quick-release structure, mainstream packages such as TO-247 and SMD packages such as TOLG and QDpak, compatible with modules within 160*80mm

• Integrated software: easy to use, easy to test, easy to output!

Triple protection for worry-free safety：

Hardware protection:

1. Scald-proof housing design with internal dual thermal insulation protection; when device temperature reaches 200°C, the fixturesurface temperature is no higher than 70℃

2. Ergonomic 'grip cap' design allows direct handling of the fixture at high temperatures

3. Safety structure design contains thermal runaway explosions internally, with a protective shield adding another layer of safety

Software protection:

Software limits heating power, with millisecond-response internal PID interlock and intelligent protection against overcurrent and thermal runaway.

Process safety protection:

Safety interlock with the CS-3000 semiconductor curve tracer for full electrical and thermal isolation during testing

Precise temperature control, verified by cross-comparison:

Technical highlights:

✅ Multi-zone independent PID temperature control algorithm for excellent thermal stability

✅ Temperature control accuracy of ±1°C with fast, safe heating

✅ Cross-verified with thermal imager and high-precision thermometer

Test assurance:

✅ Supports both ramp and constant-temperature test modes with uninterrupted data acquisition

Intelligent software — intuitive and easy to operate

◎ Datasheet-style test condition setup, easy for anyone to get started

◎ Independent temperature control module for setting temperature and hold time

◎ One-click selection to run all tests sharing the same wiring

◎ Temperature-variation testing starts intelligently once you enter the target temperatures and stages

Graphical UI to help resolve test issues:

1. Graphical test circuit schematic design — when test data is abnormal, problem points can be quickly identified through the intuitive circuit schematic UI

2. Intuitive temperature control module with a "thermometer" design that makes temperature changes clear at a glance

3. Intelligent test indicator lights — only selected tests light up, preventing damage from misoperation

One-click output, professional reports:

Automated output: includes temperature characteristic curves, parameter comparison tables, conclusion pages, and more

Loop mode for comparing device variability across batches:

◎ Boosts batch testing efficiency

◎ No manual data cleanup—tables generated in one click

◎ Outliers stand out clearly

Paired with CS stable high-power testing, covering3kV, 5kV（15~1500A）

Micro-current test accuracy up to1pA

System heating temperature range:RT~175℃

Test items: IV, Vth, Rds(on), leakage current, etc.

Compliant with standards: JEDEC, AEC-Q101, etc.

Fixture design: quick-release structure, mainstream packages such as TO-247 and SMD packages such as TOLG and QDpak, compatible with modules within 160*80mm

Integrated software: easy to use, easy to test, easy to output!

Full-cycle empowerment from R&D to mass production:

R&D laboratory: Rapidly verify device temperature characteristics, optimize chip thermal design and manufacturing processes

Production line quality inspection: Batch automated testing, quickly providing customers with a professional and accurate report

Failure analysis: Reproduction of faults under high-temperature conditions, safety assurance under high-power testing

Optional touchscreen or basic TCU version, compatible with various semiconductor parameter analyzers.