{"translation": "Jiechuang self-developed PD-2000X Double Pulse (DPT) Device Dynamic Parameter Analysis System"}

Model：PD-2000X Country of Origin：China

Category：Dynamic Parameter Test System

Overview：

The PD2400-IF is a highly adaptable dual-pulse dynamic parameter test system that, together with the DS-8KSWA-J23 SiC modular dynamic test unit, forms a modular system-level dynamic test solution. The system uses flexible module interfaces and international standard signal transmission protocols to ensure data interoperability, compatibility and traceable consistency of high-speed signals between test instruments and sensors, and to provide a sound basis for parameter compensation—making it one of the industry's professional and efficient dynamic parameter test solutions.

Features

Specifications

Application Notes

Functions & Configuration

The PD2400-IF consists primarily of a measurement system, power supply system, control system, safety system, and fixture set. The power supply system mainly provides the power required for testing the DUT modules in the test system, including high-voltage power supplies, charge/discharge circuits, and fixtures. The control system integrates host and slave systems and is responsible for controlling and operating the various test bench devices, such as high-voltage power supply charging and discharging, dual-pulse drive signal output, waveform acquisition and analysis (high-speed oscilloscopes and probes), and device temperature loading control, while also executing all test commands and data acquisition. The measurement system is used to measure the test parameters required for the DUT, and mainly includes high-definition multi-channel digital oscilloscopes, high-performance optically isolated probe sets, high-frequency high-voltage differential probes and Rogowski coils, non-inductive shunt resistors, and other high-speed signal sensor devices. The auxiliary system is mainly used for test signal generation and powering the driver board, and mainly includes a control board with dual-pulse signal output and a DC regulated power supply. The fixture mainly provides the tooling conditions required for testing the DUT: it mainly includes a driver, bus capacitor, optically isolated probe options, non-inductive coaxial shunt and other test socket option modules, a heating module, and power adjustment.

The PD2400-IF hardware adopts a modular design, with all modules connected and controlled through a central control system. In addition to the systems above, users can easily add environmental chambers, liquid cooling, and other systems as needed, which can be controlled once connected to the central control system via communication protocols. If users change or upgrade components such as the digital oscilloscope, existing functions can be upgraded by extending or modifying the software protocol.

The PDS500 software is built on the mature and stable C# technology while also offering flexibility. The functions of each module are independent of one another, and different functions can be added according to user requirements. Users can customize configurations and test conditions, and the software completes testing according to user requirements.

System block diagram

The PD2400-IF mainly consists of a central control unit, high-performance oscilloscope, high-performance voltage and current probes, high-voltage power supply, optional inductive load, power module mounting stage, data acquisition system, safety control system, and fixtures.

SiC Mosfet, IGBT Turn-on Ton Turn-off Toff characteristics	td（on）	Turn-on delay
	tr	Rise time
	td（off）	Turn-off delay
	tf	Fall time
	ton	Turn-on time
	toff	Turn-off time
	di/dt(on)	Turn-on di/dt
	dv/dt(on)	Turn-on dv/dt
	di/dt(off)	Turn-off di/dt
	dv/dt(off)	Turn-off dv/dt
	Eon	Turn-on loss
	Eoff	Turn-off loss
	VGEmax	Gate voltage spike
	VCEmax	First pulse turn-off spike
Reverse recovery characteristics	ReverseRecoveryImax	Maximum current during reverse recovery
	-diF/dt	Diode reverse recovery di/dt
	dv/dt(Diode)	Second pulse turn-on V_FMaximum slope
	IRM	Diode reverse recovery peak current
	PRM	Diode reverse recovery maximum power dissipation
	Erec	Diode reverse recovery loss
	VRM	Diode reverse recovery peak voltage
	trr	Diode reverse recovery time
	Qrr	Diode reverse recovery charge
	ΔVCE	Bus voltage droop value
	Q_g	(Total gate charge (turn-on)
Short-circuit characteristics	VGEmax	IGBTGate peak voltage
	I_SC	Short-circuit current
	VCEmax	IGBTTurn-off peak voltage
	t_SC	Short-circuit time
	E_SC	Short-circuit energy

System configuration list

No.	Name	Specifications and model	Brand	Origin	Quantity	Detailed parameters
1	8Channel high-definition oscilloscope	IWATSU DS-8058	IWATSU	Japan	1套	8Channel/500MHz, full sampling rate @12-bit high-resolution mode, 16-bit in HD mode, Supports multi-level triggering, Auto, Normal, Single, PASS/FAIL 15.6-inch high-definition display Sampling rate: 5Gs/S Memory depth: 120Mpts/CH Supports USB/LAN for remote control Dual ZOOM waveform magnification function, enabling analysis of turn-on and turn-off waveform details of devices within the same time base. Input sensitivity: 1mv to 1V/div (50Ω), 1mv to 10V/div (1MΩ) Includes DS-8000 VIEWER multi-function offline/online analysis software
2	Ultra-high-speed differential probe (for Vgs)	PMK BumbleBEE(Includes PS-02)	PMK	Germany	1套	Bandwidth：400MHz Rise time: 875ps 50X, 100X, 250X, 500X four-step adjustable attenuation ratio Differential voltage: ±2000V or 1400V rms Common-mode voltage: ±2000V or 1400V rms Input impedance: 10 MΩ \|\| 2.5 pF Common-mode rejection ratio DC: 80dB, 60dB@3.2MHz , 100 MHz: 40 dB, 400 MHz: >35 dB
3	High-Voltage Differential Probe(Vds)	HDP1520	TRONOVO	China	1套	Bandwidth：DC-200Mhz Differential voltage: 1500V Attenuation: 50X~500X Oscilloscope interface: BNC Common-mode rejection ratio: DC: 80Db, 100kHz: 60 dB, 50 MHz: >26 dB
4	High-temperature resistant type High-frequency current probe (isolated)	IWATSU SS-286A-H(-40up to 150°C)	IWATSU	Japan	1套	Maximum current 1200A, supports manual zero-offset adjustment Induction ring length: 80mm Insulation capability: 1.2Kv insulation Operating temperature: -40°C to 150°C applicable range
5	Non-inductive high-frequency Shunt (	SSDN-414-05	T&M	USA	1套	Optional per actual requirements, 50mΩ , Bandwidth2Ghz Interface: BNC with test cable
6	Phase correction unit	IE-1360	IWATSU	Japan	1套	Output voltage: ≥250V Output current: ≥50A (coil) Output mode: synchronized pulse current and voltage output Self phase shift: ≤2nS
7	Programmable pulse signal source	DPS-200	JCI	China	1套	Fiber-optic isolated output, dual-pulse and PWM output controllable, T1(ON)=0.1~500us, T2(OFF)=0.1~500us, T3(ON)=0.1~500us adjustable. Error, resolution: 0.1us
8	Multi-stage adjustable inductance	AirC100	JCI	China	1套	Inductance multi-range settings: 10μH, 20μH, 50μH, 100μH, 500μH (31mohm-220mohm), inductance accuracy: ≤±5μH Maximum working voltage: 7000Vrms transient peak current: 200μs, 1000A, Operating temperature: -40/+60℃
9	Programmable high-voltage power supply	JEC-XY01-2100	JCI	China	1套	Includes charge/discharge module, Supports output voltage range 0V~2000V, Overvoltage protection 2100V, current 1000mA, Resolution ≤0.1V, voltage accuracy≤0.2%+2LSB
10	Universal test driver board	Module test fixture	JCI	China	1套	Adjustable gate voltage, adjustable gate resistance, fast matching of gate parameters, compatible with HPD, HP1, Econo series and other package modules
11	Fixture	TOTest fixture	JCI	China	1套	Low-inductance design, built-in busbar, capacitor, driver, for testing TO-220-3, TO-247-4, HPD and other package SiC devices
12	Capacitor busbar	GTC-PA	JCI	China	1个	Custom DC busbar, compatible with multiple mainstream packages (HPD, HP1, Econodual, DC6, etc.)
13	Capacitance	GTC-200U	JCI	Japan	1个	Optional according to actual requirements
14	Industrial control host	I5/8G	DELL	USA	1套	17" Above monitor
15	System rack	JEM2400-12	JCI	China	1套	1, flexible safety mainframe and temperature sensor, voltage sensor 2, Control system: automatic charge/discharge: the system automatically charges according to the set voltage and automatically discharges after the test is completed. 2, Safety system: electromagnetic lock and limit switch control ensure the safety door can only be opened when power is off 3, fault detection system: device fault self-check, automatic identification of test faults and protection, ensuring the safety of equipment and the object under test.

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{"translation": "Jiechuang self-developed PD-2000X Double Pulse (DPT) Device Dynamic Parameter Analysis System"}

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