GaN HEMT Rds(on)dynamic measure GaN Dynamic On-Resistance Measurement Probe SS-350
Model:iwatsu ss-350 Country of Origin:Japan Category:Dynamic On-Resistance Rds(on)dynamic
Overview:High-precision measurement of the on-voltage at the start of GaN device switching, particularly suitable for evaluating low on-resistance GaN devices.With high stability, multiple ranges and high-precision clamping capability, it can complete mohm-level dynamic device on-resistance measurement under extremely high withstand voltage conditions. For GaN current collapse research, SS-350 is one of the best measurement solutions of its kind worldwide.
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