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PHS-500 TO Package SiC Power Discrete Device Temperature @ Electrical Parameter Automatic Test System, Jiechuang Self-Developed

PHS-500 TO Package SiC Power Discrete Device Temperature @ Electrical Parameter Automatic Test System, Jiechuang Self-Developed

Model:PHS-500      Country of Origin:China

Category:Semiconductor Parameter Analyzer

Overview:

Precise 175°C high-temperature control, automated static parameter testing, one-click professional datasheet generation, full-process test safety assurance

The system complies with AEC-Q101/AQG-324 and other test standards, covering temperature-dependent tests of ★BVces, ★ICES, ★IGES, ★VCE(sat)/RDS(on), ★VGE(th), ★Transfer, ★Output, ★Vsd/Is, and more





Features
Specifications
Application Notes
Functions & Configuration

Performance advantages through combined hardware and software:

Stable high-power testing up to 3 kV (15–1000 A)

Ultra-low current measurement accuracy down to 1 pA

System heating range: RT to 175°C

Test items: I-V, Vth, Rds(on), leakage current, etc.

Compliant with standards: JEDEC, AEC-Q101, AQG-324, etc.

Fixture design: quick-release structure, TO-247 mainstream package

Software integration: easy to use, easy to test, easy to export!


Triple protection for complete safety:

Hardware protection:

1. Anti-scald housing with dual internal thermal insulation; surface temperature max. 70°C

2. Ergonomic grab-handle design for direct fixture handling at high temperatures

3. Safety structure contains thermal-runaway explosions internally, with a protective cover as an added safeguard


Software protection:

Software limits heating power with intelligent protection against overcurrent and thermal runaway


Process safety protection:

Safety interlock with the tester ensures electrical and thermal isolation throughout testing


Precise temperature control with cross-validation:

Technical highlights:

✅ Multi-zone independent PID temperature control algorithm for excellent thermal stability

✅ Temperature control accuracy of ±1°C with fast, safe heating

✅ Cross-validated with thermal imaging camera and high-precision thermometer


Test assurance:

✅ Supports both temperature ramp and constant-temperature test modes with continuous data acquisition


Intelligent software — intuitive and easy to operate


◎Datasheet-style test condition setup, so even beginners can get started easily

◎Independent temperature control module for setting target temperature and soak time

◎One-click selection to run all tests sharing the same wiring

◎Temperature sweep testing starts automatically once you enter the target temperatures and stages



Graphical UI to help resolve test issues:

1. Graphical test circuit schematic design — when test data looks abnormal, the intuitive circuit schematic UI helps you quickly pinpoint the problem

2. Intuitive temperature control module with a "thermometer" design, making temperature changes clear at a glance

3. Smart test indicator lights — only selected tests light up, preventing damage from misoperation


One-click output of professional reports:



Automated output: includes temperature characteristic curves, parameter comparison tables, conclusion pages, and more


Loop mode for comparing device-to-device variation across batches:

◎Improves batch testing efficiency

◎Test data auto-formatted into a table in one click

◎Outliers stand out at a glance




CS delivers stable high-power testing, covering 3kV (15~1000A)


Low-current measurement accuracy up to 1 pA


System heating temperature range: RT to 175℃


Test items: IV, Vth, Rds(on), leakage current, etc.


Compliant with standards: JEDEC, AEC-Q101, etc.


Fixture design: quick-release structure, TO-247 mainstream package


Integrated software: easy to use, easy to test, easy to output!





Full-cycle empowerment from R&D to mass production:


R&D laboratory: quickly verify device temperature characteristics, optimize chip thermal design and manufacturing process


Production line quality inspection: batch automated testing, quickly providing customers with a professional and accurate report


Failure analysis: reproduction of faults under high-temperature conditions, safety assurance under high-power testing



Optional touchscreen or basic TCU, compatible with various semiconductor parameter analyzers

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