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Products
Keysight B1506A power device analyzer

Keysight B1506A power device analyzer

Model:B1506A      Country of Origin:USA

Category:Semiconductor Parameter Analyzer

Overview:

Ensure first-pass success in your circuit designs with comprehensive power device characterization

The Keysight B1506A power device analyzer/curve tracer is a comprehensive solution for circuit design, helping power electronics circuit designers select the right power devices for their applications and get the most value from their power electronics products. It evaluates all relevant device parameters across different operating conditions, including I-V parameters (breakdown voltage and on-resistance), three-terminal FET capacitance, gate charge, and power loss. The B1506A power device analyzer/curve tracer for circuit design offers full curve tracer functionality and more.

Standard B1506A features

  • Wide operating range up to 3 kV/1500 A

  • Fully automated, fast thermal testing from -50 °C to +250 °C

  • Automatic creation of power device (semiconductor and component) datasheets

  • Auto-record function prevents data loss

B1506A IV Suite Features

  • Fully automated, high-speed IV measurements on packaged and on-wafer devices (Ron, BV, leakage, Vth, Vsat, etc.)

  • Narrow pulse widths (down to 10 µs) prevent device self-heating for more accurate characterization of actual device performance.

  • Oscilloscope view (time-domain view) monitors actual voltage/current pulse waveforms for accurate measurements.

  • Flexible, scalable configuration extends current range from 20 A to 500 A or 1500 A with optional CV and Qg modules.

Full feature set of the B1506A kit

  • All IV kit features

  • Measure transistor input, output, and reverse transfer capacitance (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) of packaged devices at 3 kV

  • Measure gate charge (Qg) curves of packaged devices

  • Calculate power losses (conduction, drive, and switching losses)

The B1506A is a feature-rich solution that helps identify defective devices under real-world circuit operating conditions, including wide voltage and current ranges (3 kV and 1500 A), a broad temperature measurement range (-50 °C to +250 °C), fast pulse generation capability, and sub-nA current measurement resolution. Its unique software interface uses the device datasheet format that users are already familiar with, so devices can be characterized easily without any formal training. Integrated switching circuitry within the test fixture enables fully automated testing, automatically switching between high-voltage and high-current tests, as well as between IV and CV measurements.

In addition, a unique plug-in device test fixture socket adapter eliminates cable connections and other human errors. The B1506A also supports fully automated thermal characterization. This can be performed using an integrated Thermostream controller or a Thermal Plate. Because the device under test is in close proximity to the B1506A's measurement resources, there are no significant parasitic effects caused by climate chamber cable extensions.

As a result, you can accurately evaluate oscillation-free ultra-high currents up to 1500 A under low and high temperature conditions. B1506A helps you fully unlock the value of your final product and accelerate product development, revolutionizing power electronics circuit design.

The IV kits (H20, H50, H70) are priced comparably to conventional curve tracers. With the B1506A, you get far more advanced capabilities. You can also upgrade any B1506A IV kit (H20, H50, H70) to add current ranges or CV/Qg measurement capability (options H21, H51, H71).


Features
Specifications
Application Notes
Functions & Configuration

Standard B1506A features

  • Wide operating range up to 3 kV/1500 A

  • Fully automated, high-speed thermal testing from -50 °C to +250 °C

  • Automatic creation of power device (semiconductor and component) datasheets

  • Auto-record function prevents data loss

B1506A IV Suite Features

  • Fully automated, high-speed IV measurements on packaged and on-wafer devices (Ron, BV, leakage, Vth, Vsat, etc.)

  • Narrow pulse widths (down to 10 µs) prevent device self-heating for more accurate characterization of actual device performance.

  • Oscilloscope view (time-domain view) monitors actual voltage/current pulse waveforms for accurate measurements.

  • Flexible, scalable configuration extends current range from 20 A to 500 A or 1500 A with optional CV and Qg modules.

B1506A Kit: Complete Feature Set

  • IV Kit: Full Capabilities

  • Measure transistor input, output, and reverse transfer capacitance (Ciss, Coss, Crss, Cies, Coes, Cres) and gate resistance (Rg) on packaged devices at 3 kV

  • Measure gate charge (Qg) curves on packaged devices

  • Calculate power losses (conduction, drive, and switching losses)


Test all parameters of power devices under a wide range of operating conditions to improve the circuit design performance of power electronic products

— Measures all IV parameters (Ron, BV, leakage, Vth, Vsat, etc.)

 — Measure transistor input, output, and reverse transfer capacitance (Ciss, Coss, Crss, Cies, Coes, Cres, Rg) under high-voltage bias conditions 

— Gate charge (Qg) curve measurement

— Power loss (conduction, drive, and switching) testing

— Easy to use and supports fully automated measurement

— Datasheet characterization mode enables users to quickly and easily evaluate datasheet parameters

— Wide operating I/V (1500 A, 3 kV) and thermal test range (-50°C to +250°C) 

— Oscilloscope view provides visual verification of pulsed measurement waveforms

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B1506A IV Suite

  • B1506A-H20 20 A / 3 kV current measurement

  • B1506A-H50 500 A / 3 kV current-voltage measurement

  • B1506A-H70 1500 A / 3 kV current measurement

B1506A Complete Kit

  • B1506A-H21 20 A / 3 kV drain-source voltage, source-gate voltage, and gate charge measurement

  • B1506A-H51 500 A / 3 kV IV, C-V, and gate charge measurement

  • B1506A-H71 1500 A / 3 kV IV, C-V, and gate charge measurement


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