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Products
Vamtek HSF-K13 series power semiconductor B1506A fixture & Cx series test socket

Vamtek HSF-K13 series power semiconductor B1506A fixture & Cx series test socket

Model:HSF-K13      Country of Origin:China

Category:Semiconductor Parameter Analyzer

Overview:

A professional-grade extended test solution purpose-built for the Keysight B1506A/B1505A power device analyzer, delivering a one-stop power semiconductor test solution with high accuracy, broad compatibility, and high reliability.


Features
Specifications
Application Notes
Functions & Configuration


This solution combines two core modules—the HSF-K13 test fixture and the HSF-Cx series professional test sockets—delivering breakthroughs in both hardware compatibility and measurement accuracy.

Seamless Compatibility with the Original Ecosystem

Direct plug-in connection to the B1506A original test box, shielded cables perfectly matched to the B1505A, and native compatibility with the Curve Tracer interface—plug and play with no additional setup.

Four-Wire Full-Kelvin Precision Architecture

The Cx series test sockets use a standard four-wire full-Kelvin design that effectively eliminates contact resistance interference, ensuring extreme accuracy for mΩ-level ultra-low resistance and high-voltage leakage measurements.

Compatible with All Mainstream Device Packages

Full support for TO-247-3/4, TOLL, QDPAK, HU3PAK, TOLG, TOLT, TO-263 and other power device packages, covering the testing needs of both SiC/GaN third-generation semiconductors and conventional silicon-based devices.

Reliable Multi-Scenario Test Support

Ideally suited to IV characteristics, CV capacitance, high-voltage leakage, RdsON on-resistance and other key parameter tests from room temperature up to 175°C, meeting the full workflow requirements of power device R&D and validation.


Item

Technical specifications

Compatible mainframe

Keysight Technologies B1506A(plug-in type),B1505A(shielded wiring type) power device analyzer

B1506A Connection method

Plug-in connection to the original factory test box with no additional adapter cables, minimizing signal loss

B1505A Connection method

Custom shielded connection cable connects to the original factory test box, with anti-interference design to suppress external noise

Standard interface

Native Curve Tracer Curve tracer interface, fully compatible with the original factory test interface

Core accessories

Cx Full series Kelvin power device test sockets (available in standard, high-temperature, low-outgassing, and low-inductance types)

Item

Environmental parameters

Normal operating temperature

0℃ ~ +40℃

Operating temperature range of the full series

-55℃ ~ +175℃(standard model);-55℃ ~ +220℃(high-temperature model Cx Test socket)

Storage temperature

-20℃ ~ +60℃

Operating humidity

20% RH ~ 80% RH, non-condensing

Working air pressure

Standard atmospheric pressure

Special environment adaptation

Low outgassing version Cx Test socket, suitable for semiconductor cleanrooms

Item

Mechanical and structural parameters

Mounting method

Keysight Technologies B1506A(plug-in type),B1505A(shielded wiring type) power device analyzer

Replacement method

Plug-in quick-release structure, single test socket installation/removal time <5s, quick switching between multiple packages

Compatible package list

Through-hole package:TO-247-3、TO-247-4L、TO-3P; SMD Surface mount package:TOLL、TOLG、TOLT、QDPAK、HU3PAK、R2PAK、TO-252 (D-PAK)、TO-263 (D2-PAK)、TO-263-7;

Structural protection

Fully insulated housing + High-voltage physical isolation design, electric shock protection


Supported items

Test items

Threshold voltage

Temperature changeV(th),Vge(th)

Transfer Characteristics

Temperature changeId-Vgs, Ic-Vge

Gate leakage current

Temperature changeIgss, Iges

Output leakage current

Temperature changeIdss, Ices

Output Characteristics

Temperature changeId-Vds, Ic-Vce

Gate Charge

Temperature changeQg, Qg(th), Qgs, Qgd

On resistance

Temperature changeRds-on. Vce(sat)

CV Junction capacitance test

Ciss、Coss、Crss and junction capacitance parameters


The corresponding PHS power semiconductor temperature variation test system/junction temperature simulation system and corresponding heating fixtures can be selected according to the CX test socket model

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