Model：HSF-200 Country of Origin：China
Category：SMU Source Measure Unit
The HSF-100/200 Test Box is a high-performance test fixture and environmental solution designed specifically for source measure units (SMUs) and semiconductor parameter analyzers.
In laboratories where electromagnetic interference from various instruments is increasingly complex, researchers often face challenges such as fluctuating test data, difficulty capturing small signals, and the need to synchronize multiple SMUs when a single unit cannot meet testing requirements—SMUs must also be integrated with instruments from different domains, such as spectrometers and thermal shock systems, to form composite test setups.
The HSF series test box—with its interference shielding, stable data, support for multiple SMUs, and integration with instruments across different domains—is an excellent solution to these problems.
Fully compatible：Supports the full Keithley source meter series (including 2400, 2600B, etc.), the full Keysight source meter series (including the B2900 series, etc.), and mainstream domestic source meters (Lianxun, Tonghui, etc.).
Flexible configuration:Offers multiple interface options and test boxes for different sizes, allowing flexible selection of various source meters to help you overcome test challenges. Supports 2-wire, 4-wire (four-probe), and various device and material test model modes, particularly suitable for device characterization analysis and material resistivity and other IV tests, meeting the ever-changing requirements of test systems.
Efficient testing:Through electromagnetic shielding technology and low-noise circuit design, the signal path design is optimized to minimize noise and signal attenuation, shield external interference, and accurately capture signals, achieving fA-level resolution and perfectly addressing high-precision fields such as piezoelectric materials.
Software ecosystem support:Can be customized to create professional test software for different research topics of research teams, with customization for greater convenience. Can be connected to optical instruments such as spectrometers for testing photodetectors and laser diodesto form a comprehensive analysis system.
Ultra-small size:Flexibly choose the test environment, save laboratory space, and easily integrate into various test platforms (e.g., paired with a heating section to test temperature-related LIV characteristics of laser diodes).
Custom fixtures:For different fields such as two-dimensional materials, fixtures can be customized and placed in the internal test space, with a simple, replaceable, and convenient design.
Excellent cost-performance:Improve the SMU's interference immunity and measurement accuracy at low cost, and expand the uses of existing equipment.
Safety protection:The test box provides a safe testing environment, protecting personnel safety. The INTERLOCK safety interlock design immediately cuts off all outputs when the protective cover is opened, and the enclosure is grounded to both ensure interference shielding and avoid testing hazards!
Stable testing:The SMU itself has high sensitivity but poor data stability; electromagnetic shielding plus a fixed low-noise circuit greatly improves stability, making it particularly suitable for measuring fields such as piezoelectric materials and memristors.
Appendix: Technical Specifications Table
Parameter | Specification |
Dimensions: L*W*H | HSF100(92×80×62mm),HSF200(200x235x147.5mm) |
Number of DC channels | 4（HSF100）、7（HSF200） |
Number of pulse channels | 2（HSF100），HSF200Customizable |
Maximum voltage | ±200V |
Maximum current | ±PULSE 3A (MAX)，±DC 1A MAX |
Noise suppression ratio | >60 dB (below 100 MHz) |
Minimum current resolution | 1fA（HSF100）、 10fA（HSF200）/DC |
CV test range | 100HZ-5MHZ（200V） |
Operating temperature range | 10℃~30℃ |
Interface type | Optional triaxial, banana plug, SMA interfaces |
Optional custom software | EC-201 high-precision measurement system software |
Optional fixtures | 1 mm pin to banana plug, alligator clip, test hook |
Supported test types | Two-terminal, three-terminal, and four-terminal discrete devices such as memristors, flexible materials, photodetectors, and laser diodes |
Compatible source meter and semiconductor parameter analyzer models | Keithley 4200ACS, 2400 series, 2600B series, Keysight B1500, B1505, B1506 and B2900 series source meters, mainstream domestic source meters (Lianxun, Tonghui, etc.) |
Memristors, flexible materials, photodetectors, laser diodes and other two-terminal, three-terminal, four-terminal discrete devices, material resistivity
Custom fixtures:Targeting2D materialsand other different fields, customizable fixtures can be placed in the internal test space, with a simple and replaceable convenient design.
Software ecosystem support: can becustomizedfor research teams' different projectsProfessional test software, customizable, more convenient. Can connect to testPhotodetectors、Laser diodeoptical instruments such as spectrometers to form a comprehensive analysis system.
System integration:Can connect to flexible material mechanical testing instruments, spectrometers, hot plates, etc., to form a comprehensive analysis system.
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