Vamtek Advanced Semiconductor SiC/GaN Package Semiconductor Parameter Analyzer Adapter Fixture Test Socket

The CX series test sockets enable accurate evaluation of TO-3P and TO-247 packaged power devices, which is critical for development and manufacturing. Our sockets deliver innovative technology and high reliability to maximize accurate characterization of MOSFETs built on next-generation semiconductor materials such as SiC (silicon carbide) and GaN (gallium nitride). The CX series is purpose-built for semiconductor static parameters, dynamic switching parameters, and device HTRB reliability testing, maintaining stable electrical and mechanical integrity even under harsh conditions.

1. Broad compatibility with the IWATSU CS3000/5000/8000 series and Keysight B1500/1505/1506 series semiconductor parameter analyzers.

2. Kelvin connection in the socket separates the current path from the voltage measurement path, eliminating the effects of wiring and contact resistance on measurements and ensuring high-accuracy results.

3. Withstands high and low temperatures (-55 to 220°C); the socket itself is minimally affected by temperature changes, maintaining stable mechanical and electrical characteristics under harsh conditions for reliability testing and beyond.

4. Low stray inductance (low Ls) delivers stable data and reduced interference in dynamic switching characterization.

5. Low internal resistance means lower noise and reduced leakage current in static testing, ensuring more precise measurements (accurate SiC RdsON measurement).

6. Low-outgassing materials make it better suited to cleanroom use, with minimal contamination.

7. Broad package compatibility, supporting various DIP and SMD packages and various SiC and GaN packages.

8. Handles high current and high voltage: up to DC 50 A and DC 2500 V (1 min, 25°C), with a maximum of DC 5000 V.

9. Customizable or jointly developed with the customer.

For selection, please refer to the documents on the resource download page or contact us by phone