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Loss analysis of soft magnetic cores and inductive components
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Loss analysis of soft magnetic cores and inductive components
Dynamic Switching Performance Evaluation of SiC and GaN Devices
Static parameter testing of power devices SiC IGBT
12-bit High-Definition Multi-Channel Digital Oscilloscope
Power and Harmonic Parameter Evaluation of Variable-Frequency Motors
Bidirectional Grid-Feeding Power Supply and Load Solution
{"translation": "Jiechuang self-developed PD-2000X Double Pulse (DPT) Device Dynamic Parameter Analysis System"}
IWATSU DM-8000H Optically Isolated Multi-channel 12-bit High-voltage Floating Isolated Oscilloscope IWATSU Japan
IWATSU DS-8108, DS-8054 12-Bit Resolution 8-Channel Oscilloscope Original Import from Japan
IWATSU SE-6000 / SE-6010 Fiber-Optic Isolated 4-Channel Differential Probe Compatible with Oscilloscopes, Japan IWATSU
IWATSU DM-8000H Optically Isolated Multi-channel 12-bit High-voltage Floating Isolated Oscilloscope IWATSU Japan
IWATSU SE-6000 / SE-6010 Fiber-Optic Isolated 4-Channel Differential Probe Compatible with Oscilloscopes, Japan IWATSU
IWATSU HV-P60A/HV-P30A 30KV and 60KV High-Frequency Extra-High-Voltage Probe Iwatsu Japan
IWATSU DS-8108, DS-8054 12-Bit Resolution 8-Channel Oscilloscope Original Import from Japan
Japan IWATSU SS-284A/289A/287/288A/286A Rogowski Coil High-Frequency Pulse Current Transformer Flexible Probes
IWATSU SS-623/624/625/626/627/628/629S/M Iwatsu Rogowski Coil Current Probe
Cascade TESLA300 Meibao High-Power 12-Inch Semi-Automatic Probe Station
Cascade TESLA 200 FormFactor High-Power 8-Inch Semi-Automatic Probe Station
CASCADE-IWATSU Tesla series 8-inch high-voltage SiC probe station system
Cascade Summit200 FormFactor Fully/Semi-Automatic Probe Station
Apollowave AP-200 Apollo Microwave High-Power Probe Station
APOLLOWAVE Desktop Compact 0-200 Degree IV/CV Probe Station
Apollowave a-300CS Apollo -60/350 Degree High-Low Temperature RF Manual Probe Station System
Apollowave MJ-8D Apollo 8K cryogenic vacuum physical materials probe station
Cascade EPS200RF RF Probe Station
Cascade SUMMIT12000 Semi-Automatic Probe Station System
Measurement methods for current collapse effects in gallium nitride (GaN) devices (AlGaN/GaN HEMTs)
Current collapse is a degradation phenomenon unique to gallium nitride (GaN) devices—particularly AlGaN/GaN HEMTs—under high-voltage stress. It manifests as a drop in output current and an increase in on-resistance, severely compromising power output and reliability.
Current Status and Prospects of Soft Magnetic Metal Powder Core Materials
Research Progress on High-Frequency Soft Magnetic Materials for SiC and GaN Power Electronic Devices
Application differences of the Kelvin four-wire method, four-probe method, van der Pauw method, and Chen Cunli method in measuring resistance-related parameters
How to use Lissajous figures in AC mode on the IWATSU CS-3300 curve tracer for failure analysis
Types of electron irradiation accelerators and typical applications (changes in electrical characteristics of semiconductor materials and devices under irradiation conditions)
Electrical characteristic testing of power devices under temperature variation: the key to ensuring performance and reliability
WayneKerr 3260B Precision Magnetic Component Analyzer
WayneKerr 6430/6440 Precision Component Analyzer
MICROTEST 6632 Impedance Analyzer 10Hz~1/3/5/10/20/30/50MHz
Easycon 200X semiconductor parameter analysis software system
High-Temperature Chip Acceptability Test System WAT-200KA
Keithley 2606B Series SMU Source Measure Units Tektronix USA TEKTRONIX
Keithley SMU2650 Series 2651A/26527A High-Power SourceMeter® Tektronix USA TEKTRONIX
Keithley 2400 Standard Series SMU USA TEKTRONIX
Keithley 2601B-PULSE 10 µs Pulse Generator/SMU USA TEKTRONIX
Keithley 2600B series 2601B/2602B/2604B/2611B/2612B/2614B/2634B/2635B/2636B SMU instruments Tektronix TEKTRONIX USA
Keithley 2400 Graphical Series 2450/2460/2461/2470 SMU Instruments Four-Quadrant Precision Voltage and Current Source/Load Tektronix TEKTRONIX USA
TEKTRONIX 4200-SCS KEITHLEY Semiconductor Parameter Analyzer
IWATSU HSA4101-IW/HSA4014-IW/IE-1125B Iwatsu Precision Four-Quadrant Wideband Power Amplifier
Dr Hubert A1230-02 Precision Power Amplifier 4-quadrant voltage amplifier
Drhubert A 1110-40-QE 7MHZ Precision Power Amplifier
Drhubert A 1110-05-E Precision Power Amplifier 4-quadrant voltage amplifier
Dr Hubert A1230-01 Precision Power Amplifier 4-quadrant voltage amplifier
PMK High-voltage Differential Probe Series HORNET® 4000Vrms Suitable for SiC Module Double-pulse Evaluation
PMK Firefly FF-1500 Optically Isolated Probe 1.5GHz Compatible with IsoVu TIVP MMCX
Micsig SigOFIT Optical Isolated Probe OIP100B, OIP200B, MOIP350P
IWATSU SE-6000 Extra-High-Voltage 100KV Fiber-Optic Isolated Differential Measurement Probe Unit
IWATSU SE-6000 Extra-High-Voltage 100KV Fiber-Optic Isolated Differential Measurement Probe Unit
PMK 2GHZ High-Frequency Differential Probe HS-DP 2000
PMK Tetris 1GHZ-2.5GHZ High-Impedance High-Frequency FET Probe Replaces LeCroy ZS
PMK BUMBLEBEE 400MHZ@6KV High Common-Mode Rejection Ratio Differential Probe Replaces Optical Isolation
IWATSU SE-6000 / SE-6010 Fiber-Optic Isolated 4-Channel Differential Probe Compatible with Oscilloscopes, Japan IWATSU
T&M SSDN-414 CVR Double Pulse Ids Coaxial High-Frequency Precision Current Shunt for Double Pulse
HIU-1000-B High-Precision AC/DC Current Meter Tester
T&M SSDN/SDN Coaxial High-Frequency Precision Shunt for Double Pulse
T&M SDN/SSDN/W Series Coaxial Resistor for Double Pulse Coaxial High-Frequency Current Shunt CRV High Frequency
UK PEM CWT Series AC Current Probe 30A--300KA Pulse Current
Cybertek HCP8150 (150A/12MHz) Integrated Zhiyong High-Frequency AC/DC Current Probe DC/AC
PEM UK CWT MiniHF Series High-Frequency Pulse Current Probe 30A--30KA
UK PEM CWT Mini Series AC High-Frequency Pulse Current Probe 30A-12KA-30KA
PMK KHT1000C probe calibrator voltage probe calibration signal source
PMK High di/dt 100MHZ High-Frequency Current Probe Wideband Current
High-frequency loss and BH parameter analysis of soft magnetic materials and inductive devices
How to correctly evaluate the scenarios where magnetic cores of different materials meet high-frequency and high-current applications—the IWATSU B-H Analyzer System is the world's most authoritative and most widely applied high-frequency AC B-H characteristic tester for soft magnetic materials in this field.
WBG semiconductors - static parameter evaluation of silicon carbide power devices
Power Semiconductor Datasheet Room-Temperature and High-Temperature Static Parameter Measurement Solution
IWATSU-CS3000/5000 Series Semiconductor Analyzer Gate Charge (Qg) Test Guide
SiC/GaN silicon carbide double-pulse dynamic parameter and dynamic on-resistance testing
The Vamtek CX-600 series perfectly accommodates new low-Ls package SiC and GaN devices
KEYSIGHT B1505A/B1506A Test Box SiC Adapter TO or TOLL Test Socket Fixture
UHV -- Optical Isolation Measurement of High-Voltage Grid Signals and UHV Signals
IWATSU's latest high-frequency B-H Analyzer SY-8264 will be officially released to the Chinese market in the first half of 2026.
IWATSU's latest B-H Analyzer SY-8264 will be officially released to the Chinese market in the first half of 2026. Supports multiple frequency bandwidth options: 10Hz-1MHz, 10Hz-10MHz, 10Hz-30MHz
IWATSU releases the DS8K-SWA dynamic parameter test and analysis system for SiC IGBT power devices
IWATSU Yanzaki releases the latest-generation modular semiconductor curve tracer CS-8000 series, fully compatible with the B1505A
IWATSU Iwatsu Measurement releases 100MHZ high-bandwidth Rogowski current probe SS-680/660—the world's latest
IWATSU and Cascade Microtech jointly release a test system for silicon carbide-based power semiconductors
IWATSU releases SKEW calibrator for CONDUCTION LOSS probes to solve power device conduction loss issues
IWATSU releases the latest SE-6000/6010 optically isolated probe test system
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